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1. (WO2013119604) METHODS AND SYSTEMS FOR ANALYZING SAMPLES

Pub. No.:    WO/2013/119604    International Application No.:    PCT/US2013/024843
Publication Date: Fri Aug 16 01:59:59 CEST 2013 International Filing Date: Thu Feb 07 00:59:59 CET 2013
IPC: G01N 21/71
Applicants: MATERIALYTICS, LLC
Inventors: MCMANUS, Catherine E.
DOWE III, James W.
LIKES, Tristan M.
DOWE IV, James W.
Title: METHODS AND SYSTEMS FOR ANALYZING SAMPLES
Abstract:
This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library