Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2013116553) METHOD FOR HEIGHT CONTROL FOR SINGLE ELECTRON TUNNELING FORCE SPECTROSCOPY AND DYNAMIC TUNNELING FORCE MICROSCOPY
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2013/116553 International Application No.: PCT/US2013/024196
Publication Date: 08.08.2013 International Filing Date: 31.01.2013
IPC:
G01Q 10/00 (2010.01) ,G01Q 60/10 (2010.01)
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
10
Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
60
Particular types of SPM [Scanning-Probe Microscopy] or apparatus therefor; Essential components thereof
10
STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
Applicants:
UNIVERSITY OF UTAH RESEARCH FOUNDATION [US/US]; 615 Arapeen Drive Suite 310 Salt Lake City, Utah 84108, US
Inventors:
WILLIAMS, Clayton Covey; US
JOHNSON, Jon Paul; US
Agent:
BETHARDS, Matthew S.; STOEL RIVES LLP 201 So. Main Street, Suite 1100 One Utah Center Salt Lake City, Utah 84111, US
Priority Data:
61/593,13331.01.2012US
Title (EN) METHOD FOR HEIGHT CONTROL FOR SINGLE ELECTRON TUNNELING FORCE SPECTROSCOPY AND DYNAMIC TUNNELING FORCE MICROSCOPY
(FR) PROCÉDÉ DE CONTRÔLE DE HAUTEUR POUR SPECTROSCOPIE DE FORCE À EFFET TUNNEL MONOÉLECTRONIQUE ET MICROSCOPIE DE FORCE À EFFET TUNNEL DYNAMIQUE
Abstract:
(EN) Height control systems and/or methods are implemented for dynamic force tunneling microscopy and single electron tunneling force spectroscopy to improve their accuracy.
(FR) Des systèmes et/ou des procédés de contrôle de hauteur sont mis en œuvre pour la microscopie à effet tunnel de force dynamique et la spectroscopie de force à effet tunnel monoélectronique afin d'améliorer leur précision.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)