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1. (WO2013116553) METHOD FOR HEIGHT CONTROL FOR SINGLE ELECTRON TUNNELING FORCE SPECTROSCOPY AND DYNAMIC TUNNELING FORCE MICROSCOPY
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2013/116553    International Application No.:    PCT/US2013/024196
Publication Date: 08.08.2013 International Filing Date: 31.01.2013
IPC:
G01Q 10/00 (2010.01), G01Q 60/10 (2010.01)
Applicants: UNIVERSITY OF UTAH RESEARCH FOUNDATION [US/US]; 615 Arapeen Drive Suite 310 Salt Lake City, Utah 84108 (US)
Inventors: WILLIAMS, Clayton Covey; (US).
JOHNSON, Jon Paul; (US)
Agent: BETHARDS, Matthew S.; STOEL RIVES LLP 201 So. Main Street, Suite 1100 One Utah Center Salt Lake City, Utah 84111 (US)
Priority Data:
61/593,133 31.01.2012 US
Title (EN) METHOD FOR HEIGHT CONTROL FOR SINGLE ELECTRON TUNNELING FORCE SPECTROSCOPY AND DYNAMIC TUNNELING FORCE MICROSCOPY
(FR) PROCÉDÉ DE CONTRÔLE DE HAUTEUR POUR SPECTROSCOPIE DE FORCE À EFFET TUNNEL MONOÉLECTRONIQUE ET MICROSCOPIE DE FORCE À EFFET TUNNEL DYNAMIQUE
Abstract: front page image
(EN)Height control systems and/or methods are implemented for dynamic force tunneling microscopy and single electron tunneling force spectroscopy to improve their accuracy.
(FR)Des systèmes et/ou des procédés de contrôle de hauteur sont mis en œuvre pour la microscopie à effet tunnel de force dynamique et la spectroscopie de force à effet tunnel monoélectronique afin d'améliorer leur précision.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)