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1. (WO2013112403) INSULATION DEFECT DETECTION OF HIGH VOLTAGE GENERATOR STATOR CORE
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2013/112403 International Application No.: PCT/US2013/022389
Publication Date: 01.08.2013 International Filing Date: 21.01.2013
IPC:
G01R 31/34 (2006.01)
Applicants: GUAN, Xuefei[CN/US]; US (US)
ZHANG, Jingdan; US (US)
ZHOU, Shaohua Kevin[CN/US]; US (US)
FISCHER, Mark W.[US/US]; US (US)
ABBASI, Waheed A.[US/US]; US (US)
KARSTETTER, Scott A.[US/US]; US (US)
ADAMS, Christopher John William[US/US]; US (US)
SIEMENS CORPORATION[US/US]; 170 Wood Avenue South Iselin, New Jersey 08830, US (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IS, IT, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
SIEMENS ENERGY, INC.[US/US]; 4400 Alafaya Trail Orlando, Florida 32826-2399, US (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IS, IT, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
Inventors: GUAN, Xuefei; US
ZHANG, Jingdan; US
ZHOU, Shaohua Kevin; US
FISCHER, Mark W.; US
ABBASI, Waheed A.; US
KARSTETTER, Scott A.; US
ADAMS, Christopher John William; US
Agent: CONOVER, Michele L.; Siemens Corporation- Intellectual Property Dept. 170 Wood Avenue South Iselin, New Jersey 08830, US
Priority Data:
13/742,61516.01.2013US
61/589,42523.01.2012US
Title (EN) INSULATION DEFECT DETECTION OF HIGH VOLTAGE GENERATOR STATOR CORE
(FR) DÉTECTION DE DÉFAUTS D'ISOLATION DANS LE NOYAU DE STATOR DE GÉNÉRATEUR DE HAUTE TENSION
Abstract: front page image
(EN) In a general methodology for insulation defect identification in a generator core, a Chattock coil is used to measure magnetic potential difference between teeth. Physical knowledge and empirical knowledge is combined in a model to predict insulation damage location and severity. Measurements are taken at multiple excitation frequencies to solve for multiple characteristics of the defect.
(FR) Dans une méthodologie générale pour l'identification de défaut d'isolation dans un noyau de générateur, une bobine Chattock est utilisée pour mesurer la différence de potentiel magnétique entre les dents. Des connaissances physiques et empiriques sont combinées dans un modèle pour prédire l'emplacement et la gravité d'un dommage d'isolation. Les mesures sont prises à de multiples fréquences d'excitation pour résoudre plusieurs caractéristiques du défaut.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)