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1. (WO2013111459) EVALUATION METHOD, EVALUATION DEVICE, EVALUATION PROGRAM, RECORDING MEDIUM, AND MANUFACTURING METHOD FOR ORGANIC ELECTROLUMINESCENT ELEMENT
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2013/111459 International Application No.: PCT/JP2012/081595
Publication Date: 01.08.2013 International Filing Date: 06.12.2012
IPC:
H05B 33/12 (2006.01) ,H01L 51/50 (2006.01) ,H05B 33/10 (2006.01)
H ELECTRICITY
05
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
B
ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
33
Electroluminescent light sources
12
Light sources with substantially two-dimensional radiating surfaces
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
51
Solid state devices using organic materials as the active part, or using a combination of organic materials with other materials as the active part; Processes or apparatus specially adapted for the manufacture or treatment of such devices, or of parts thereof
50
specially adapted for light emission, e.g. organic light emitting diodes (OLED) or polymer light emitting devices (PLED)
H ELECTRICITY
05
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
B
ELECTRIC HEATING; ELECTRIC LIGHTING NOT OTHERWISE PROVIDED FOR
33
Electroluminescent light sources
10
Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
Applicants:
コニカミノルタ株式会社 Konica Minolta, Inc. [JP/JP]; 東京都千代田区丸の内二丁目7番2号 2-7-2, Marunouchi, Chiyoda-ku, Tokyo 1007015, JP
Inventors:
鍋田 博之 NABETA, Hiroyuki; JP
Agent:
特許業務法人光陽国際特許事務所 KOYO INTERNATIONAL PATENT FIRM; 東京都千代田区有楽町一丁目1番3号 東京宝塚ビル17階 17F., Tokyo Takarazuka Bldg., 1-1-3, Yurakucho, Chiyoda-ku, Tokyo 1000006, JP
Priority Data:
2012-01265825.01.2012JP
Title (EN) EVALUATION METHOD, EVALUATION DEVICE, EVALUATION PROGRAM, RECORDING MEDIUM, AND MANUFACTURING METHOD FOR ORGANIC ELECTROLUMINESCENT ELEMENT
(FR) PROCÉDÉ D'ÉVALUATION, DISPOSITIF D'ÉVALUATION, PROGRAMME D'ÉVALUATION, SUPPORT D'ENREGISTREMENT ET PROCÉDÉ DE FABRICATION D'ÉLÉMENT ÉLECTROLUMINESCENT ORGANIQUE
(JA) 有機エレクトロルミネッセンス素子の評価方法、評価装置、評価プログラム、記録媒体および製造方法
Abstract:
(EN) This evaluation method for an organic electroluminescent element, which has at least one light emitting layer between a positive electrode and a negative electrode and has a light-emitting area of 100 mm2 - 1 m2, has a step for applying a direct current voltage equal to or greater than a light emission initiation voltage for the organic electroluminescent element and measuring an impedance spectrum of the organic electroluminescent element, a step for calculating electrical capacity from the impedance spectrum, and a step for determining whether the value for the electrical capacity is either positive or negative.
(FR) Cette invention concerne un procédé d'évaluation pour un élément électroluminescent organique comprenant au moins une couche électroluminescente entre une électrode positive et une électrode négative et présentant une surface d'émission de lumière allant de 100 mm2 à 1 m2. Ledit procédé comprend les étapes consistant à : appliquer une tension continue supérieure ou égale à une tension d'initiation d'émission de lumière pour l'élément électroluminescent organique et mesurer un spectre d'impédance de l'élément électroluminescent organique; calculer la capacité électrique à partir du spectre d'impédance; et déterminer si la valeur de la capacité électrique est positive ou négative.
(JA)  陽極と陰極との間に少なくとも発光層を有し、100mm以上1m以下の発光素子面積を有する有機エレクトロルミネッセンス素子の評価方法は、有機エレクトロルミネッセンス素子に発光開始電圧以上の直流電圧を印加し、有機エレクトロルミネッセンス素子のインピーダンス分光を測定する工程と、インピーダンス分光から電気容量を算出する工程と、前記電気容量の値が正または負のいずれであるのかを判定する工程と、を有する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)