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1. (WO2013111373) IMAGE EXAMINATION METHOD AND IMAGE EXAMINATION APPARATUS
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2013/111373    International Application No.:    PCT/JP2012/073686
Publication Date: 01.08.2013 International Filing Date: 14.09.2012
IPC:
G01N 21/88 (2006.01), G06T 1/00 (2006.01), G06T 7/60 (2006.01)
Applicants: OMRON Corporation [JP/JP]; 801, Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku, Kyoto-shi, Kyoto 6008530 (JP) (For All Designated States Except US).
MINATO Yoshihisa [JP/JP]; (JP) (For US Only).
YANAGAWA Yukiko [JP/JP]; (JP) (For US Only)
Inventors: MINATO Yoshihisa; (JP).
YANAGAWA Yukiko; (JP)
Agent: SERA Kazunobu; Acropolis 21 Building 6th floor, 4-10, Higashi Nihonbashi 3-chome, Chuo-ku, Tokyo 1030004 (JP)
Priority Data:
2012-015810 27.01.2012 JP
Title (EN) IMAGE EXAMINATION METHOD AND IMAGE EXAMINATION APPARATUS
(FR) PROCÉDÉ D'EXAMEN D'IMAGES ET APPAREIL D'EXAMEN D'IMAGES
(JA) 画像検査方法および画像検査装置
Abstract: front page image
(EN)According to the invention, a parameter, which is used as a constraint condition in an optimum solution search process, is given, as examination area definition information, to an image examination apparatus. Then, during examination of a to-be-examined object, the image examination apparatus uses, as the constraint condition, the examination area definition information to determine an optimum solution of examination area in an image of the to-be-examined object. In this way, for each of a plurality of to-be-examined objects, the position and shape of a respective examination area are determined.
(FR)L'invention concerne un paramètre, utilisé comme condition de contrainte dans un processus de recherche de solutions optimales, qui est transmis comme information de définition de la région d'examen, à un appareil d'examen d'images. Lors de l'examen d'un objet à examiner, l'appareil d'examen d'images utilise ensuite, comme condition de contrainte, les informations de définition de la région d'examen pour déterminer une solution optimale de la région d'examen dans une image de l'objet à examiner. De cette manière, pour chaque objet d'une pluralité d'objets à examiner, la position et la forme d'une région d'examen respective sont déterminées.
(JA) 本発明では、最適解探索処理において拘束条件として用いられるパラメタを検査領域定義情報として画像検査装置に与える。そして、検査対象物の検査を行う際は、画像検査装置がこの検査領域定義情報を拘束条件として用いて検査対象物画像の中から検査領域の最適解を求めることにより、検査対象物ごとに個別に検査領域の位置及び形状を決定する。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)