WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO2013059333) METHOD AND APPARATUS FOR DETERMINING EYE TOPOGRAPHY
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2013/059333    International Application No.:    PCT/US2012/060631
Publication Date: 25.04.2013 International Filing Date: 17.10.2012
IPC:
A61B 3/10 (2006.01), A61B 3/12 (2006.01), G01B 9/02 (2006.01)
Applicants: EYEDEAL SCANNING, LLC [US/US]; 124 Crescent Road Needham, MA 02494 (US)
Inventors: BISHOP, Robert, P.; (US)
Agent: HERBSTER, George, A.; 100 Cummings Center Suite 213C Bervely, MA 01915 (US)
Priority Data:
13/654,151 17.10.2012 US
61/547,904 17.10.2011 US
Title (EN) METHOD AND APPARATUS FOR DETERMINING EYE TOPOGRAPHY
(FR) PROCÉDÉ ET APPAREIL PERMETTANT DE DÉTERMINER LA TOPOGRAPHIE OCULAIRE
Abstract: front page image
(EN)A method and apparatus for measuring the topography of the corneal and scleral regions of the eye. The measurements provide surface contours that are useful in the manufacture of scleral contact lenses.
(FR)La présente invention concerne un procédé et un appareil permettant de mesurer la topographie de la région cornéenne et de la région sclérale de l'œil. Les mesures donnent des contours de surface qui sont utiles dans la fabrication de lentilles de contact sclérales.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)