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Machine translation
1. (WO2013050729) MEASUREMENT METHOD
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2013/050729    International Application No.:    PCT/GB2012/000761
Publication Date: 11.04.2013 International Filing Date: 03.10.2012
IPC:
G01B 5/008 (2006.01)
Applicants: RENISHAW PLC [GB/GB]; (GB)
Inventors: DANBURY, Richard, Neil; (GB).
WALLACE, David, Sven; (GB)
Agent: ROLFE, Edward, William; Renishaw plc Patent Department New Mills Wotton-under-Edge Gloucestershire GL12 8JR (GB)
Priority Data:
11250839.5 06.10.2011 EP
Title (EN) MEASUREMENT METHOD
(FR) PROCÉDÉ DE MESURE
Abstract: front page image
(EN)A method of locating a feature of an object in which the method comprises bringing a stylus of a contact probe mounted on a positioning apparatus into contact with the object to obtain at least first and second measurements of the object. Each which the measurements gives rise to a range of possible points of contact between the object and a part of the stylus along its length and therefore inherently containing uncertainty in the location of the object along said length. The at least first and second measurements are used to reduce the extent of said uncertainty which comprises using stylus orientation related information associated with the at least first and second measurements.
(FR)Procédé de localisation d'une caractéristique d'un objet consistant à amener le stylet d'une sonde de contact montée sur un appareil de positionnement en contact avec l'objet pour obtenir au moins des premières et des secondes mesures de cet objet. Chacune des mesures renvoie à une plage de points de contact possibles entre l'objet et une partie du stylet sur sa longueur et contient donc intrinsèquement une incertitude quant à la position de cet objet sur ladite longueur. Lesdites premières et secondes mesures s'utilisent pour réduire l'ampleur de cette incertitude au moyen d'informations sur l'orientation du stylet associées aux premières et secondes mesures.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)