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1. WO2013009533 - SCANNER WITH PHASE AND PITCH ADJUSTMENT

Publication Number WO/2013/009533
Publication Date 17.01.2013
International Application No. PCT/US2012/045361
International Filing Date 03.07.2012
IPC
G01B 11/25 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
25by projecting a pattern, e.g. moiré fringes, on the object
CPC
G01B 11/2527
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
25by projecting a pattern, e.g. ; one or more lines,; moiré fringes on the object
2518Projection by scanning of the object
2527with phase change by in-plane movement of the patern
G01B 11/2531
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
25by projecting a pattern, e.g. ; one or more lines,; moiré fringes on the object
2531using several gratings, projected with variable angle of incidence on the object, and one detection device
G01B 11/2536
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
25by projecting a pattern, e.g. ; one or more lines,; moiré fringes on the object
2536using several gratings with variable grating pitch, projected on the object with the same angle of incidence
Applicants
  • FARO TECHNOLOGIES, INC. [US]/[US] (AllExceptUS)
  • BRIDGES, Robert, E. [US]/[US] (UsOnly)
  • KRUSE, Ryan [US]/[US] (UsOnly)
  • GONG, Yu [CN]/[US] (UsOnly)
  • MCCORMACK, Paul [US]/[US] (UsOnly)
  • LAFOND, Emmanuel [US]/[US] (UsOnly)
Inventors
  • BRIDGES, Robert, E.
  • KRUSE, Ryan
  • GONG, Yu
  • MCCORMACK, Paul
  • LAFOND, Emmanuel
Agents
  • KOSAKOWSKI, Richard, H.
Priority Data
61/507,76314.07.2011US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SCANNER WITH PHASE AND PITCH ADJUSTMENT
(FR) SCANNEUR PERMETTANT UN AJUSTEMENT DE PHASE ET D'ESPACEMENT
Abstract
(EN)
A method for determining three-dimensional coordinates of an object point on a surface of an object, including steps of providing a transparent plate having a first region and a second region, the second region having a different wedge angle than the first region; splitting a first beam of light into a first light and a second light; sending the first light through the first region or the second region; combining the first light and the second light to produce a fringe pattern on the surface of the object, the pitch of the fringe pattern depending on the wedge angle through which the first light travels; imaging the object point onto an array point on a photosensitive array to obtain an electrical data value; determining the three-dimensional coordinates of the first object point based at least in part on the electrical data value.
(FR)
L'invention concerne un procédé de détermination des coordonnées tridimensionnelles d'un point d'objet situé à la surface d'un objet, ledit procédé comprenant les étapes consistant à utiliser une plaque transparente comportant une première région et une seconde région, la seconde région présentant un angle de coin différent de celui de la première région; diviser un premier faisceau lumineux en une première lumière et une seconde lumière; diriger la première lumière à travers la première région ou la seconde région; combiner la première lumière et la seconde lumière afin de produire un diagramme de franges à la surface de l'objet, l'espacement des franges du diagramme dépendant de l'angle de coin à travers lequel la première lumière se propage; former une image du point d'objet sur un point d'ensemble d'un ensemble photosensible de façon à obtenir une valeur de données électriques; déterminer les coordonnées tridimensionnelles du premier point d'objet en fonction au moins en partie de la valeur de données électriques.
Also published as
DE112012002965
DE1120120029658
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