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1. (WO2012117160) METHOD FOR CONDITION MONITORING OF PROCESS ELEMENT, MONITORING SYSTEM, AND PROCESS ELEMENT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2012/117160    International Application No.:    PCT/FI2012/050192
Publication Date: 07.09.2012 International Filing Date: 27.02.2012
IPC:
G01M 13/00 (2006.01), B65G 43/02 (2006.01)
Applicants: METSO FABRICS INC. [FI/FI]; Yrittäjänkatu 21 FI-33710 Tampere (FI) (For All Designated States Except US).
ENQVIST, Rauno [FI/FI]; (FI) (For US Only).
METTÄLÄ, Juha [FI/FI]; (FI) (For US Only).
NIEMINEN, Petri [FI/FI]; (FI) (For US Only)
Inventors: ENQVIST, Rauno; (FI).
METTÄLÄ, Juha; (FI).
NIEMINEN, Petri; (FI)
Agent: KOLSTER OY AB; Iso Roobertinkatu 23 P.O.Box 148 FI-00121 Helsinki (FI)
Priority Data:
20115200 28.02.2011 FI
Title (EN) METHOD FOR CONDITION MONITORING OF PROCESS ELEMENT, MONITORING SYSTEM, AND PROCESS ELEMENT
(FR) PROCÉDÉ DE SURVEILLANCE DE L'ÉTAT D'UN ÉLÉMENT DE TRAITEMENT, SYSTÈME DE SURVEILLANCE ET ÉLÉMENT DE TRAITEMENT
Abstract: front page image
(EN)The invention relates to a method for monitoring the condition of a process element, a monitoring system, and a process element. The process element (1) comprises at least one wear detector (3) arranged inside the structure of the element at a wear thickness (HK) from the outer surface (8) of the element being monitored.
(FR)L'invention porte sur un procédé de surveillance de l'état d'un élément de traitement, sur un système de surveillance et sur un élément de traitement. L'élément de traitement (1) comprend au moins un détecteur d'usure (3) agencé à l'intérieur de la structure de l'élément à une épaisseur d'usure (HK) à partir de la surface externe (8) de l'élément qui est surveillé.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)