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1. (WO2012115007) FAULT TREE ANALYSIS SYSTEM, FAULT TREE ANALYSIS METHOD AND PROGRAMME
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2012/115007    International Application No.:    PCT/JP2012/053826
Publication Date: 30.08.2012 International Filing Date: 17.02.2012
Chapter 2 Demand Filed:    20.12.2012    
IPC:
G06F 11/22 (2006.01)
Applicants: NEC Corporation [JP/JP]; 7-1, Shiba 5-chome, Minato-ku, Tokyo 1088001 (JP) (For All Designated States Except US).
XIANG Jianwen [CN/JP]; (JP) (For US Only)
Inventors: XIANG Jianwen; (JP)
Agent: UDAKA Katsuki; No2, Azuma Bldg. 5fl, 14, Kandasakumacho 1-chome, Chiyoda-ku, Tokyo 1010025 (JP)
Priority Data:
2011-035872 22.02.2011 JP
Title (EN) FAULT TREE ANALYSIS SYSTEM, FAULT TREE ANALYSIS METHOD AND PROGRAMME
(FR) SYSTÈME D'ANALYSE PAR ARBRE DE DÉFAILLANCES, PROCÉDÉ D'ANALYSE PAR ARBRE DE DÉFAILLANCES ET PROGRAMME
(JA) 故障の木解析システム、故障の木解析方法及びプログラム
Abstract: front page image
(EN)The present invention is a fault tree analysis system which has a k/n gate logical conjunction elimination means for eliminating a logical conjunction that includes a disjointed basic and simple k/n, and eliminating a logical conjunction having a rank which is greater than the maximum rank of the minimal cut-set.
(FR)La présente invention porte sur un système d'analyse par arbre de défaillances qui est doté d'un moyen d'élimination de conjonction logique à porte k/n destiné à éliminer une conjonction logique comprenant une porte k/n basique et simple disjointe et à éliminer une conjonction logique ayant un rang supérieur au rang maximum de la coupe minimale.
(JA)本発明は、故障の木の解析システムであって、ディスジョイントな基本及び単純k/nを含む論理積を除去し、最小カットセット群の最大階数より大きい階数の論理積を取り除くk/nゲート論理積除去手段を有する故障の木の解析システムである。
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)