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Machine translation
1. (WO2012111955) APPARATUS AND METHOD FOR HORIZONTALLY MEASURING AN OBJECT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2012/111955    International Application No.:    PCT/KR2012/001097
Publication Date: 23.08.2012 International Filing Date: 14.02.2012
IPC:
G01B 11/26 (2006.01)
Applicants: SEO, Bong Min [KR/KR]; (KR).
LEE, Jung Eui [KR/KR]; (KR) (For US Only)
Inventors: SEO, Bong Min; (KR).
LEE, Jung Eui; (KR)
Agent: LEE, In-Haeng; YULMIN IP Law Firm 4th Floor Seokcheon Building 1551-5 Seocho-dong, Seocho-gu Seoul 137-873 (KR)
Priority Data:
10-2011-0013409 15.02.2011 KR
Title (EN) APPARATUS AND METHOD FOR HORIZONTALLY MEASURING AN OBJECT
(FR) APPAREIL ET PROCÉDÉ POUR MESURER HORIZONTALEMENT UN OBJET
(KO) 피반사체 수평측정장치 및 수평측정방법
Abstract: front page image
(EN)The present invention relates to an apparatus and method for horizontally measuring an object. The apparatus for horizontally measuring the object includes: a light source; a reflective plate for reflecting light emitted from the light source toward the light source; first and second optical modules disposed in an optical path defined between the light source and the reflective plate; and a light receiving part for receiving the light. The first optical module transmits the light emitted from the light source so that the light is incident into the second optical module, and collects the light transmitted by the second optical module or the light reflected by the second optical module to reflect the light toward the light receiving part. The second optical module transmits the light reflected by the reflective plate so that the light is incident into the first optical module, or reflects the light transmitted by the first optical module toward the object to collect the light reflected by the object, thereby reflecting the collected light toward the first optical module.
(FR)La présente invention porte sur un appareil et un procédé pour mesurer horizontalement un objet. Ledit appareil comprend : une source de lumière ; une plaque réfléchissante pour réfléchir la lumière émise par la source de lumière vers la source de lumière ; des premier et second modules optiques, disposés dans un chemin optique défini entre la source de lumière et la plaque réfléchissante ; une partie de réception de lumière pour recevoir la lumière. Le premier module optique transmet la lumière émise par la source de lumière de telle sorte que la lumière est incidente sur le second module optique, et capte la lumière transmise par le second module optique ou la lumière réfléchie par le second module optique pour réfléchir la lumière vers la partie de réception de lumière. Le second module optique transmet la lumière réfléchie par la plaque réfléchissante, de telle sorte que la lumière est incidente sur le premier module optique, ou réfléchit la lumière transmise par le premier module optique vers l'objet pour capter la lumière réfléchie par l'objet, réfléchissant ainsi la lumière captée vers le premier module optique.
(KO)본 발명에서는 광원, 광원으로부터 출사되는 광을 광원으로 반사하는 반사판, 광원과 반사판 사이에 형성되는 광경로에 배치되는 제 1 광학모듈 및 제 2 광학모듈 및 광을 수광하는 수광부를 포함하고, 제 1 광학모듈은 광원으로부터 출사되는 광을 투과시켜 제 2 광학모듈로 입사시키고, 제 2 광학모듈을 투과하거나 또는 제 2 광학모듈에 의해 반사된 광을 수집하여 상기 수광부로 반사하고, 제 2 광학모듈은 반사판으로부터 반사된 광을 투과시켜 제 1 광학모듈로 입사하거나 또는 제 1 광학모듈을 투과한 광을 피반사체로 반사시킨 후 피반사체로부터 반사된 광을 수집하여 제 1 광학모듈로 반사하는 피반사체 수평측정장치가 제공된다.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Korean (KO)
Filing Language: Korean (KO)