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Pub. No.:    WO/2012/093479    International Application No.:    PCT/JP2011/050090
Publication Date: 12.07.2012 International Filing Date: 06.01.2011
G01R 1/067 (2006.01), G01R 31/26 (2006.01)
Applicants: CLOVER TECHNOLOGY CO., LTD. [JP/JP]; 58-1, Kishiki-cho 1-chome, Omiya-ku, Saitama-shi, Saitama 3300843 (JP) (For All Designated States Except US).
OKUMA Masafumi [JP/JP]; (JP) (For US Only)
Inventors: OKUMA Masafumi; (JP)
Agent: SANO Ryota; Sansui Patent Firm, 4th Floor, Akasaka Wing Bldg., 6-6-15, Akasaka, Minato-ku, Tokyo 1070052 (JP)
Priority Data:
(JA) プローブピン-ソケット組立体
Abstract: front page image
(EN)This probe pin-socket assembly, which is intended to provide a novel means for improving the durability of probe pins with a short total length, is provided with a second impelling member for impelling a probe pin barrel in such a manner that the probe pin barrel is separated from a measurement substrate when a load is added to an electrode contact part of the probe pin barrel with the assembly being held on the measurement substrate. The second impelling member enables the contact pressure between the electrode contact part of the probe pin and a measurement electrode to be increased.
(FR)L'ensemble broche-douille pour sonde de la présente invention, qui est un nouveau moyen pour améliorer la durabilité des broches de sonde ayant une longueur totale courte, est doté d'un second élément de poussée servant à pousser un corps de broche pour sonde de telle manière que le corps de broche pour sonde est séparé d'un substrat de mesure quand une charge est ajoutée à une partie de contact d'électrode du corps de broche pour sonde, l'ensemble étant maintenu sur le substrat de mesure. Le second élément de poussée permet d'augmenter la pression de contact entre la partie de contact d'électrode de la broche pour sonde et une électrode de mesure.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)