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1. WO2012084994 - ATOMIC FORCE MICROSCOPE PROBE, METHOD FOR PREPARING SAME, AND USES THEREOF

Publication Number WO/2012/084994
Publication Date 28.06.2012
International Application No. PCT/EP2011/073466
International Filing Date 20.12.2011
IPC
G01Q 20/04 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
20Monitoring the movement or position of the probe
04Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
G01Q 60/42 2010.1
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
24AFM or apparatus therefor, e.g. AFM probes
38Probes, their manufacture or their related instrumentation, e.g. holders
42Functionalisation
CPC
B82Y 35/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
35Methods or apparatus for measurement or analysis of nanostructures
G01Q 10/045
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
10Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
04Fine scanning or positioning
045Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
G01Q 20/04
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
20Monitoring the movement or position of the probe
04Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
G01Q 60/38
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
38Probes, their manufacture, or their related instrumentation, e.g. holders
G01Q 60/42
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
38Probes, their manufacture, or their related instrumentation, e.g. holders
42Functionalisation
Applicants
  • COMMISSARIAT À L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVES [FR]/[FR] (AllExceptUS)
  • POLESEL-MARIS, Jérôme [FR]/[FR] (UsOnly)
  • BERTHELOT, Thomas [FR]/[FR] (UsOnly)
  • VIEL, Pascal [FR]/[FR] (UsOnly)
Inventors
  • POLESEL-MARIS, Jérôme
  • BERTHELOT, Thomas
  • VIEL, Pascal
Agents
  • AUGARDE, Eric
Priority Data
10 6103822.12.2010FR
Publication Language French (fr)
Filing Language French (FR)
Designated States
Title
(EN) ATOMIC FORCE MICROSCOPE PROBE, METHOD FOR PREPARING SAME, AND USES THEREOF
(FR) SONDE DE MICROSCOPE À FORCE ATOMIQUE, SON PROCÉDÉ DE PRÉPARATION ET SES UTILISATIONS
Abstract
(EN) The present invention relates to an atomic force microscope probe which includes: (i) a piezoelectric resonator provided with two electrodes and coated with an insulating layer; and (ii) a tip attached to said coated resonator and functionalised by at least one grouping or molecule of interest. The present invention also relates to the method for preparing same and to the various uses thereof.
(FR) La présente invention concerne une sonde de microscope à force atomique comprenant (i) un résonateur piézo-électrique muni de deux électrodes et revêtu d'une couche isolante et (ii) une pointe fixée sur ledit résonateur revêtu et fonctionnalisée par au moins un groupement ou une molécule d'intérêt. La présente invention concerne également son procédé de préparation et ses différentes utilisations.
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