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1. WO2012071203 - REAL SPACE MAPPING OF IONIC DIFFUSION AND ELECTROCHMICAL ACTIVITY IN ENERGY STORAGE AND CONVERSION MATERIALS

Publication Number WO/2012/071203
Publication Date 31.05.2012
International Application No. PCT/US2011/060547
International Filing Date 14.11.2011
IPC
G01N 27/00 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
G01R 31/26 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
G01R 31/00 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
CPC
B82Y 35/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
35Methods or apparatus for measurement or analysis of nanostructures
G01Q 60/02
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
02Multiple-type SPM, i.e. involving more than one SPM techniques
G01Q 60/30
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
30Scanning potential microscopy
G01Q 60/60
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
60SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes
Applicants
  • UT-BATTELLE, LLC [US]/[US] (AllExceptUS)
  • KALININ, Sergei, V. [US]/[US] (UsOnly)
  • BALKE, Nina [DE]/[US] (UsOnly)
  • KUMAR, Amit [IN]/[US] (UsOnly)
  • DUDNEY, Nancy, J. [US]/[US] (UsOnly)
  • JESSE, Stephen [US]/[US] (UsOnly)
Inventors
  • KALININ, Sergei, V.
  • BALKE, Nina
  • KUMAR, Amit
  • DUDNEY, Nancy, J.
  • JESSE, Stephen
Agents
  • DOCKREY, Jasper, W.
Priority Data
13/291,48008.11.2011US
61/458,51024.11.2010US
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) REAL SPACE MAPPING OF IONIC DIFFUSION AND ELECTROCHMICAL ACTIVITY IN ENERGY STORAGE AND CONVERSION MATERIALS
(FR) CARTOGRAPHIE D'ESPACE RÉEL DE DIFFUSION IONIQUE ET D'ACTIVITÉ ÉLECTROCHIMIQUE DANS LE STOCKAGE D'ÉNERGIE ET LES MATÉRIAUX DE CONVERSION
Abstract
(EN) A method and system for probing mobile ion diffusivity and electrochemical reactivity on a nanometer length scale of a free electrochemically active surface includes a control module that biases the surface of the material. An electrical excitation signal is applied to the material and induces the movement of mobile ions. An SPM probe in contact with the surface of the material detects the displacement of mobile ions at the surface of the material. A detector measures an electromechanical strain response at the surface of the material based on the movement and reactions of the mobile ions. The use of an SPM tip to detect local deformations allows highly reproducible measurements in an ambient environment without visible changes in surface structure. The measurements illustrate effective spatial resolution comparable with defect spacing and well below characteristic grain sizes of the material.
(FR) L'invention concerne un procédé et un système qui sert à sonder la diffusivité des ions mobiles et la réactivité électrochimique, à une échelle de longueur nanométrique, d'une surface électrochimiquement active et qui comprend un module de commande qui polarise la surface du matériau. Un signal d'excitation électrique est appliqué au matériau et induit le mouvement des ions mobiles. Une sonde de microscope-sonde à balayage (SPM) en contact avec la surface du matériau détecte le déplacement des ions mobiles à la surface du matériau. Un détecteur mesure une réaction de contrainte électromécanique à la surface du matériau sur la base du mouvement et des réactions des ions mobiles. L'utilisation d'un embout SPM pour détecter les déformations locales permet des mesures fortement reproductibles dans un milieu ambiant sans changements visibles de structure de surface. Les mesures illustrent une résolution spatiale efficace comparable à l'espacement de défauts et bien en dessous des tailles de grain caractéristiques du matériau.
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