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1. WO2012067125 - PROBE UNIT

Publication Number WO/2012/067125
Publication Date 24.05.2012
International Application No. PCT/JP2011/076334
International Filing Date 15.11.2011
IPC
G01R 1/073 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
G01R 1/067 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
CPC
G01R 1/0483
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
0433Sockets for IC's or transistors
0483Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
G01R 1/06722
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
06716Elastic
06722Spring-loaded
G01R 1/07314
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
07307with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
07314the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
G01R 1/07364
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
07307with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
07364with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
Applicants
  • 日本発條株式会社 NHK SPRING CO., LTD. [JP]/[JP] (AllExceptUS)
  • 風間 俊男 KAZAMA, Toshio [JP]/[JP] (UsOnly)
  • 広中 浩平 HIRONAKA, Kohei [JP]/[JP] (UsOnly)
  • 石川 重樹 ISHIKAWA, Shigeki [JP]/[JP] (UsOnly)
Inventors
  • 風間 俊男 KAZAMA, Toshio
  • 広中 浩平 HIRONAKA, Kohei
  • 石川 重樹 ISHIKAWA, Shigeki
Agents
  • 酒井 宏明 SAKAI, Hiroaki
Priority Data
2010-25723217.11.2010JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) PROBE UNIT
(FR) UNITÉ DE SONDE
(JA) プローブユニット
Abstract
(EN)
This probe unit is provided with: a plurality of large-diameter probes; a plurality of small-diameter probes each having a diameter that is smaller than that of the large-diameter probes; a large-diameter probe holder that is provided with a plurality of large holes, which individually hold the plurality of large-diameter probes, penetrating in the direction of thickness, and that houses in the state of the end of a small-diameter probe contacting a large-diameter probe at one end of each large hole; and a small-diameter probe holder that is provided with a plurality of small holes, which individually hold the plurality of small-diameter probes in a removal-preventing state, and that is stacked onto the large-diameter probe holder in a manner so that the direction of thickness thereof matches the direction of thickness of the large-diameter holder. The center axis in the lengthwise direction of interconnecting large holes and small holes differ from each other, and the plurality of small holes include those that are such that the distance between the center axes of two adjacent small holes is smaller than the distance between the center axes of the two large holes with which the small holes respectively interconnect.
(FR)
La présente unité de sonde comporte : une pluralité de sondes à grand diamètre ; une pluralité de sondes à petit diamètre dont le diamètre de chacune est inférieur à celui des sondes à grand diamètre ; un support de sondes à grand diamètre qui comporte une pluralité de grands trous qui maintiennent chacun un individu de la pluralité de sondes à grand diamètre, pénétrant dans la direction de l'épaisseur, et qui loge à l'état de l'extrémité d'une sonde à petit diamètre en contact avec une sonde à grand diamètre à une extrémité de chaque grand trou ; et un support de sondes à petit diamètre qui comporte une pluralité de petits trous qui maintiennent chacun un individu de la pluralité de sondes à petit diamètre à un état empêchant le retrait, et qui est empilé sur le support de sondes à grand diamètre de telle manière que la direction de son épaisseur correspond à la direction de l'épaisseur du support à grand diamètre. Les axes centraux dans la direction de la longueur d'interconnexion des grands trous et des petits trou sont différents l'un de l'autre, et la pluralité de petits trous comprend ceux qui sont tels que la distance entre les axes centraux de deux petits trous adjacents est inférieure à la distance entre les axes centraux de grands trous qui s'interconnectent respectivement avec les petits trous.
(JA)
 複数の大径プローブと、各々が大径プローブよりも径が小さい複数の小径プローブと、複数の大径プローブを個別に保持する複数の大孔部が厚さ方向に貫通して設けられ、各大孔部の一端部で小径プローブの端部を大径プローブと接触した状態で受容する大径プローブホルダと、複数の小径プローブを個別に抜け止めした状態で保持する複数の小孔部が厚さ方向に貫通して設けられ、当該厚さ方向と大径プローブホルダの厚さ方向とが一致するように大径プローブホルダに積層された小径プローブホルダとを備え、互いに連通する大孔部および小孔部の長手方向の中心軸は異なり、複数の小孔部には、互いに隣接する二つの前記小孔部の中心軸間距離が各小孔部に連通する二つの大孔部の中心軸間距離より小さいものが含まれる。
Also published as
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