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1. WO2012064116 - TEST TRAY FOR TESTING LIGHT-EMITTING DIODES

Publication Number WO/2012/064116
Publication Date 18.05.2012
International Application No. PCT/KR2011/008542
International Filing Date 10.11.2011
IPC
G01R 31/26 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
CPC
G01J 2001/4252
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
1Photometry, e.g. photographic exposure meter
42using electric radiation detectors
4247for testing lamps or other light sources
4252for testing LED's
G01R 1/04
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
G01R 31/2635
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
2607Circuits therefor
2632for testing diodes
2635Testing light-emitting diodes, laser diodes or photodiodes
Applicants
  • 강우테크 주식회사 KANGWU TECH CO., LTD. [KR]/[KR] (AllExceptUS)
  • 이기현 LEE, Ki Hyun [KR]/[KR] (UsOnly)
  • 심규열 SIM, Kyu Yeol [KR]/[KR] (UsOnly)
  • 홍성민 HONG, Sung Min [KR]/[KR] (UsOnly)
  • 방지원 BANG, Ji Won [KR]/[KR] (UsOnly)
  • 임정호 LIM, Jung Ho [KR]/[KR] (UsOnly)
  • 송준성 SONG, Jun Sung [KR]/[KR] (UsOnly)
Inventors
  • 이기현 LEE, Ki Hyun
  • 심규열 SIM, Kyu Yeol
  • 홍성민 HONG, Sung Min
  • 방지원 BANG, Ji Won
  • 임정호 LIM, Jung Ho
  • 송준성 SONG, Jun Sung
Agents
  • 김병진 KIM, Byung Jin
Priority Data
10-2010-011160210.11.2010KR
Publication Language Korean (KO)
Filing Language Korean (KO)
Designated States
Title
(EN) TEST TRAY FOR TESTING LIGHT-EMITTING DIODES
(FR) PLATEAU DE TEST DESTINÉ À TESTER DES DIODES ÉLECTROLUMINESCENTES
(KO) 엘이디 테스트용 테스트 트레이
Abstract
(EN)
The present invention relates to a test tray for testing light-emitting diodes (hereinafter, referred to as "LEDs"), which enables a plurality of LEDs to be mounted simultaneously in the test tray and tested while moving between processes in a final process that automatically tests the performance of LEDs produced in a manufacturing process. A plurality of produced LEDs (approximately 60 to 240 LEDs) are placed into a main body of the test tray such that the lenses of the LEDs are exposed downwardly via respective through-holes communicating with respective insertion spaces, and an optical test is accurately performed while safely protecting the lenses when transferring the LEDs between processes. To this end, a plurality of insertion spaces (18) for accommodating LEDs (1) are formed in the upper surface of a main body (17) of a test tray (16) for testing LEDs (1), and through-holes (19) communicating with the bottom of the main body (17) are formed in the bottoms of the respective insertion spaces (18) such that a test on LEDs (1) can be performed with the lenses (L) of the LEDs (1) accommodated in the respective insertion spaces (18) being exposed downwardly via the through-holes (19).
(FR)
La présente invention concerne un plateau de test destiné à tester des diodes électroluminescentes (ci-après dénommées DEL), permettant de monter simultanément une pluralité de DEL dans le plateau de test et de les tester tout en naviguant entre des procédés dans un procédé final qui teste automatiquement les performances de DEL produites dans un procédé de fabrication. Une pluralité des DEL produites (approximativement de 60 à 240 DEL) est placée dans un corps principal du plateau de test, de façon à exposer les lentilles des DEL vers le bas via des trous traversants respectifs communiquant avec des espaces d'insertion respectifs. Ensuite, un test optique est réalisé de manière précise tout en protégeant de manière sûre les lentilles lors du transfert des DEL entre les procédés. A cette fin, une pluralité d'espaces d'insertion (18), destinés à recevoir des DEL (1), est formée dans la surface supérieure d'un corps principal (17) d'un plateau de test (16) destiné à tester des DEL (1), et des trous traversants (19), communiquant avec le fond du corps principal (17), sont formés dans le fond des espaces d'insertion (18) respectifs de façon à ce qu'un test sur les DEL (1) puisse être réalisé avec les lentilles (L) des DEL (1), qui sont disposées dans les espaces d'insertion (18) respectifs et exposées vers le bas via les trous traversants (19).
(KO)
본 발명은 제조공정에서 생산된 엘이디(이하 "LED"라함)의 성능을 자동으로 테스트하는 파이널 공정에서 복수 개의 LED를 동시에 탑재하여 공정간에 이동하면서 테스트를 실시할 수 있도록 하는 엘이디 테스트용 테스트 트레이(test tray)에 관한 것으로, 생산 완료된 복수 개(대략 60 ∼ 240개정도)의 LED를 테스트 트레이의 본체에 담으면 렌즈가 삽입공간과 통하여지게 형성된 통공을 통해 하부로 노출되도록 하여 공정간에 이송시키는 과정에서 렌즈를 안전하게 보호하면서 광학적인 테스트를 정확하게 실시할 수 있도록 한 것이다. 이를 위해, 테스트 트레이(16)를 구성하는 본체(17)의 상면에 LED(1)가 담겨지는 복수 개의 삽입공간(18)이 형성된 엘이디 테스트용 트레이에 있어서, 상기 각 삽입공간(18)의 저면에 하부와 통하여지는 통공(19)을 형성하여 상기 삽입공간(18)에 담겨진 LED(1)의 렌즈(L)가 통공(19)을 통해 하부로 노출되도록 한 상태에서 LED(1)의 테스트가 이루어지도록 하는 것을 특징으로 한다.
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