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Machine translation
1. (WO2012051100) A REDUCED-PAIN ALLERGY SKIN TEST DEVICE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2012/051100    International Application No.:    PCT/US2011/055575
Publication Date: 19.04.2012 International Filing Date: 10.10.2011
IPC:
A61B 5/00 (2006.01)
Applicants: HARISH, M.D., Ziv [US/US]; (US).
RUBINSTEIN, Isaac [US/US]; (US).
ARBIT, Ehud [US/US]; (US).
WEINZIMMER, Russ [US/US]; (US)
Inventors: HARISH, M.D., Ziv; (US).
RUBINSTEIN, Isaac; (US).
ARBIT, Ehud; (US).
WEINZIMMER, Russ; (US)
Agent: WEINZIMMER, Russ; Russ Weinzimmer & Associates 614 Nashua Street, Suite 53 Milford, NH 03055 (US)
Priority Data:
12/902,030 11.10.2010 US
Title (EN) A REDUCED-PAIN ALLERGY SKIN TEST DEVICE
(FR) DISPOSITIF DE TEST CUTANÉ D'ALLERGIE À DOULEUR RÉDUITE
Abstract: front page image
(EN)An allergy skin test device is disclosed that causes less pain than commonly used devices that include multi-point sharp puncture heads. The allergy skin test device incorporates multiple dull pressure heads distributed amongst the sharp multi-point sharp puncture heads, each dull pressure head activating a neurological pain gate that reduces pain sensation typically caused by the neighboring multi-point head when it engages the skin.
(FR)La présente invention concerne un dispositif de test cutané d'allergie qui cause moins de douleur que les dispositifs couramment utilisés qui comprennent des têtes de piqûre tranchantes multipoints. Le dispositif de test cutané d'allergie incorpore des têtes de pression émoussées multiples réparties parmi les têtes de piqûre tranchantes multipoints, chaque tête de pression émoussée activant une porte de douleur neurologique qui réduit la sensation de douleur typiquement causée par la tête multipoint voisine lorsqu'il engage la peau.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)