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Machine translation
1. (WO2012047627) SYSTEM AND METHOD OF EXTENDING THE LINEAR DYNAMIC RANGE OF EVENT COUNTING
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2012/047627    International Application No.:    PCT/US2011/053395
Publication Date: 12.04.2012 International Filing Date: 27.09.2011
IPC:
G01J 1/00 (2006.01), G01J 1/28 (2006.01), G01T 1/16 (2006.01)
Applicants: PURDUE RESEARCH FOUNDATION [US/US]; 1281 Win Hentschel Blvd. West Lafayette, IN 47906 (US) (For All Designated States Except US).
SIMPSON, Garth, J. [US/US]; (US) (For US Only).
KISSICK, David, Joseph [US/US]; (US) (For US Only).
MUIR, Ryan [US/US]; (US) (For US Only)
Inventors: SIMPSON, Garth, J.; (US).
KISSICK, David, Joseph; (US).
MUIR, Ryan; (US)
Agent: BENNETT, Sid; Brinks Hofer Gilson & Lione P.O. Box 10087 Chicago, IL 60610 (US)
Priority Data:
61/386,735 27.09.2010 US
61/457,946 14.07.2011 US
Title (EN) SYSTEM AND METHOD OF EXTENDING THE LINEAR DYNAMIC RANGE OF EVENT COUNTING
(FR) SYSTÈME ET PROCÉDÉ D'EXTENSION DE LA PLAGE DYNAMIQUE LINÉAIRE DE COMPTAGE D'ÉVÉNEMENTS
Abstract: front page image
(EN)A method and apparatus for photon, ion or particle counting described that provides seven orders of magnitude of linear dynamic range (LDR) for a single detector. By explicitly considering the log-normal probability distribution in voltage transients as a function of the number of photons, ions or particles present, the binomial distribution of observed counts for a given threshold, the mean number of photons, ions or particles can be determined well beyond the conventional limit.
(FR)L'invention concerne un procédé et un appareil de comptage de photons, d'ions ou de particules qui offrent sept ordres de grandeur de plage dynamique linéaire (LDR) pour un seul détecteur. En considérant explicitement la distribution de probabilité log-normale dans les transitoires de tension en fonction du nombre de photons, d'ions ou de particules présents, la distribution binomiale des comptages observés pour un seuil donné, le nombre moyen des photons, ions ou particules peut être déterminé bien au-delà des limites traditionnelles.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)