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1. (WO2012012897) LOCALISATION OF A DEFECT ON A SECTION OF A DEAD ELECTRICAL LINE
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2012/012897 International Application No.: PCT/CA2011/050455
Publication Date: 02.02.2012 International Filing Date: 26.07.2011
IPC:
G01R 31/08 (2006.01) ,G01R 31/11 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
08
Locating faults in cables, transmission lines, or networks
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
08
Locating faults in cables, transmission lines, or networks
11
using pulse-reflection methods
Applicants:
REYNAUD, Lionel [CA/CA]; CA (UsOnly)
PINEAU, Daniel [CA/CA]; CA (UsOnly)
HYDRO-QUÉBEC [CA/CA]; 75, boul. René-Lévesque Ouest Montréal, Québec H2Z 1A4, CA (AllExceptUS)
Inventors:
REYNAUD, Lionel; CA
PINEAU, Daniel; CA
Agent:
MORIN, Luc; 210, boul. de Montarville, Suite 2009 Boucherville, Québec J4B 6T3, CA
Priority Data:
2,711,03228.07.2010CA
Title (EN) LOCALISATION OF A DEFECT ON A SECTION OF A DEAD ELECTRICAL LINE
(FR) LOCALISATION D'UN DÉFAUT SUR UNE SECTION DE LIGNE ÉLECTRIQUE HORS TENSION
Abstract:
(EN) A localisation of a defect on a section of a dead electrical line is carried out by measuring a reflection signal characterising the defect and coming from a voltage signal applied to the section. An application of the voltage signal and corresponding measures of reflection signals are simulated with a model of the section for a defect located in different areas along the section. The simulated reflection signals are compared with the measured reflection signal. A site of the defect is localised according to the area of the defect for the simulated reflection signal having a higher correlation with the second reflection signal measured.
(FR) Une localisation d'un défaut sur une section de ligne électrique hors tension est réalisée en mesurant un signal de réflexion caractérisant le défaut et découlant d'un signal de tension appliqué sur la section. Une application du signal de tension et des mesures correspondantes de signaux de réflexion sont simulés avec un modèle de la section pour un défaut situé à différents endroits le long de la section. Les signaux de réflexion simulés sont comparés avec le signal de réflexion mesuré. Un emplacement du défaut est localisé d'après l'endroit du défaut pour le signal de réflexion simulé ayant une plus grande corrélation avec le second signal de réflexion mesuré.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: French (FR)
Filing Language: French (FR)