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1. WO2011158047 - IMPROVEMENTS IN OR RELATING TO SAMPLE ANALYSIS

Publication Number WO/2011/158047
Publication Date 22.12.2011
International Application No. PCT/GB2011/051151
International Filing Date 20.06.2011
Chapter 2 Demand Filed 18.04.2012
IPC
G01N 23/20 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
CPC
G01N 23/083
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
02by transmitting the radiation through the material
06and measuring the absorption
083the radiation being X-rays
G01N 23/20083
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20083by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
G01N 23/201
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
201by measuring small-angle scattering
G01V 5/0033
GPHYSICS
01MEASURING; TESTING
VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
5Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity
0008Detecting hidden objects, e.g. weapons, explosives
0016Active interrogation, i.e. using an external radiation source, e.g. using pulsed, continuous or cosmic rays
0033Mixed interrogation beams, e.g. using more than one type of radiation beam
G06T 2207/10116
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
2207Indexing scheme for image analysis or image enhancement
10Image acquisition modality
10116X-ray image
G06T 7/0002
GPHYSICS
06COMPUTING; CALCULATING; COUNTING
TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
7Image analysis
0002Inspection of images, e.g. flaw detection
Applicants
  • THE NOTTINGHAM TRENT UNIVERSITY [GB]/[GB] (AllExceptUS)
  • EVANS, Paul [GB]/[GB] (UsOnly)
Inventors
  • EVANS, Paul
Agents
  • MURGITROYD & COMPANY
Priority Data
1010233.318.06.2010GB
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) IMPROVEMENTS IN OR RELATING TO SAMPLE ANALYSIS
(FR) AMÉLIORATIONS APPORTÉES À L'ANALYSE D'ÉCHANTILLONS OU EN RAPPORT AVEC L'ANALYSE D'ÉCHANTILLONS
Abstract
(EN) A method of sample analysis comprises irradiating a sample with electromagnetic radiation such as X-rays; collecting absorption data and scattering data; and combining the absorption and scattering data. The irradiation can be in the form of a tubular beam, a detector may be placed in a plane where Debye cones diffracted from the sample overlap at a central point for the collection of the scattering data.
(FR) Procédé d'analyse d'échantillons consistant à irradier un échantillon via un rayonnement électromagnétique tels que les rayons X ; à recueillir des données d'absorption et des données de diffusion ; et à combiner les données d'absorption et de diffusion. L'irradiation peut se faire sous la forme d'un faisceau tubulaire, un détecteur peut être placé dans un plan où des cônes de Debye diffusés par l'échantillon se chevauchent en un point central pour la collecte de données de diffusion.
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