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1. (WO2011153275) METHOD AND APPARATUS FOR ENHANCED EYE MEASUREMENT
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2011/153275    International Application No.:    PCT/US2011/038809
Publication Date: 08.12.2011 International Filing Date: 01.06.2011
IPC:
G01B 9/02 (2006.01)
Applicants: OPTOVUE, INC. [US/US]; 45531 Northport Loop W. Fremont, California 94538 (US) (For All Designated States Except US).
WEI, Jay [US/US]; (US).
SOMANI, Seema [US/US]; (US)
Inventors: WEI, Jay; (US).
SOMANI, Seema; (US)
Agent: EDWARDS, Gary J.; Haynes and Boone, LLP 2323 Victory Avenue, Suite 700 Dallas, Texas 75219 (US)
Priority Data:
61/350,258 01.06.2010 US
13/150,999 01.06.2011 US
Title (EN) METHOD AND APPARATUS FOR ENHANCED EYE MEASUREMENT
(FR) PROCÉDÉ ET APPAREIL DE MESURE OCULAIRE AMÉLIORÉE
Abstract: front page image
(EN)An imaging method according to some embodiments of the present invention includes obtaining working distance information from an optical coherence tomography system, the working distance being the working distance to the sample; obtaining information from one or more ocular systems; combining the information from said optical coherence tomography information and said ocular system; and displaying said combined information.
(FR)L'invention concerne, dans certains modes de réalisation, un procédé d'imagerie comprenant l'obtention d'informations de distance de travail issues d'un système de tomographie par cohérence optique, la distance de travail étant la distance de travail jusqu'à l'échantillon ; l'obtention d'informations issues d'un ou de plusieurs systèmes oculaires ; la combinaison des informations issues dudit système de tomographie par cohérence optique et dudit système oculaire ; et l'affichage desdites informations combinées.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)