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1. (WO2011148897) SAMPLE TEST AUTOMATION SYSTEM

Pub. No.:    WO/2011/148897    International Application No.:    PCT/JP2011/061759
Publication Date: Dec 1, 2011 International Filing Date: May 23, 2011
IPC: G01N 35/02
Applicants: HITACHI HIGH-TECHNOLOGIES CORPORATION
株式会社日立ハイテクノロジーズ
SASAKI, Takahiro
佐々木 孝浩
TAKAHASHI, Kenichi
高橋 賢一
OHGA, Hiroshi
大賀 博
FUKUGAKI, Tatsuya
福垣 達也
YANO, Shigeru
矢野 茂
YASUZAWA, Kenichi
安澤 賢一
HASEGAWA, Nozomi
長谷川 望
HANAWA, Masaaki
塙 雅明
Inventors: SASAKI, Takahiro
佐々木 孝浩
TAKAHASHI, Kenichi
高橋 賢一
OHGA, Hiroshi
大賀 博
FUKUGAKI, Tatsuya
福垣 達也
YANO, Shigeru
矢野 茂
YASUZAWA, Kenichi
安澤 賢一
HASEGAWA, Nozomi
長谷川 望
HANAWA, Masaaki
塙 雅明
Title: SAMPLE TEST AUTOMATION SYSTEM
Abstract:
Provided is a sample test automation system capable of reducing the amount of work of an operator and performing treatment required for each of samples accurately without interruption. In the sample test automation system, a sample tray (120) in which a plurality of samples (150) can be placed is prepared, an identifier for identifying the sample tray (120) is attached to the sample tray (120), a sample input unit (10) is provided with an identifier reader (111) for reading the identifier of the sample tray (120), and switching between information relating to the samples (150) is performed on the basis of the read identifier of the sample tray (120).