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1. WO2011099377 - ANALYZING METHOD OF PHASE INFORMATION, ANALYZING PROGRAM OF THE PHASE INFORMATION, STORAGE MEDIUM, AND X-RAY IMAGING APPARATUS

Publication Number WO/2011/099377
Publication Date 18.08.2011
International Application No. PCT/JP2011/051683
International Filing Date 21.01.2011
IPC
G01B 11/25 2006.1
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
25by projecting a pattern, e.g. moiré fringes, on the object
G01B 15/00 2006.1
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
15Measuring arrangements characterised by the use of wave or particle radiation
G21K 7/00 2006.1
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
7Gamma ray or X-ray microscopes
CPC
G01B 11/254
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
25by projecting a pattern, e.g. ; one or more lines,; moiré fringes on the object
254Projection of a pattern, viewing through a pattern, e.g. moiré
G01B 15/00
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
15Measuring arrangements characterised by the use of wave or particle radiation
G21K 2207/005
GPHYSICS
21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
2207Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
005Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast
Applicants
  • CANON KABUSHIKI KAISHA [JP]/[JP] (AllExceptUS)
  • NAGAI, Kentaro [JP]/[JP] (UsOnly)
Inventors
  • NAGAI, Kentaro
Agents
  • OKABE, Yuzuru
Priority Data
2010-02721410.02.2010JP
Publication Language English (en)
Filing Language English (EN)
Designated States
Title
(EN) ANALYZING METHOD OF PHASE INFORMATION, ANALYZING PROGRAM OF THE PHASE INFORMATION, STORAGE MEDIUM, AND X-RAY IMAGING APPARATUS
(FR) PROCÉDÉ D'ANALYSE D'INFORMATIONS DE PHASE, PROGRAMME D'ANALYSE DES INFORMATIONS DE PHASE, SUPPORT DE STOCKAGE ET APPAREIL D'IMAGERIE À RAYONS X
Abstract
(EN) An analyzing method for deriving phase information by analyzing a periodic pattern of moiré comprises steps of: subjecting at least a part of the periodic pattern of moiré to a windowed Fourier transform by a window function; calculating analytically, based on the moiré subjected to the windowed Fourier transform, information of a first spectrum carrying the phase information, and information of a second spectrum superimposed on the information of the first spectrum; and separating the information of the first spectrum from the information of the second spectrum, to derive the phase information.
(FR) La présente invention concerne un procédé d'analyse permettant de dériver des informations de phase par l'analyse d'un motif périodique de moiré et qui comprend les étapes suivantes : la soumission d'au moins une partie du motif périodique de moiré à une transformation de Fourier en mosaïque par une fonction de fenêtre ; le calcul analytique, sur la base du moiré soumis à la transformation de Fourier en mosaïque, des informations d'un premier spectre transportant les informations de phase et des informations d'un second spectre superposées sur les informations du premier ; et la séparation des informations du premier spectre des informations du second spectre, afin de dériver les informations de phase.
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