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1. WO2011026464 - METHOD FOR MEASURING THE FORCE INTERACTION THAT IS CAUSED BY A SAMPLE

Publication Number WO/2011/026464
Publication Date 10.03.2011
International Application No. PCT/DE2010/001004
International Filing Date 27.08.2010
Chapter 2 Demand Filed 30.06.2011
IPC
G01Q 60/16 2010.01
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
60Particular types of SPM or apparatus therefor; Essential components thereof
10STM or apparatus therefor, e.g. STM probes
16Probes, their manufacture or their related instrumentation, e.g. holders
G01Q 30/12 2010.01
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
08Means for establishing or regulating a desired environmental condition within a sample chamber
12Fluid environment
CPC
G01Q 30/12
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
30Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
08Means for establishing or regulating a desired environmental condition within a sample chamber
12Fluid environment
G01Q 60/16
GPHYSICS
01MEASURING; TESTING
QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
60Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
10STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
16Probes, their manufacture, or their related instrumentation, e.g. holders
Applicants
  • FORSCHUNGSZENTRUM JÜLICH GMBH [DE]/[DE] (AllExceptUS)
  • TEMIROV, Ruslan [RU]/[DE] (UsOnly)
  • WEISS, Christian [DE]/[DE] (UsOnly)
  • TAUTZ, Frank, Stefan [DE]/[DE] (UsOnly)
Inventors
  • TEMIROV, Ruslan
  • WEISS, Christian
  • TAUTZ, Frank, Stefan
Common Representative
  • FORSCHUNGSZENTRUM JÜLICH GMBH [DE]/[DE]
Priority Data
10 2009 039 840.603.09.2009DE
Publication Language German (DE)
Filing Language German (DE)
Designated States
Title
(DE) VERFAHREN ZUR MESSUNG DER KRAFTWECHSELWIRKUNG, WELCHE DURCH EINE PROBE HERVORGERUFEN WIRD
(EN) METHOD FOR MEASURING THE FORCE INTERACTION THAT IS CAUSED BY A SAMPLE
(FR) PROCÉDÉ DE MESURE DE L'INTERACTION DE FORCES PROVOQUÉE PAR UNE SONDE
Abstract
(DE)
Verfahren zur Messung der Kraftwechselwirkung, welche durch eine Probe hervorgerufen wird, wobei eine Spitze mit einer Biasspannung gegen die Probe beaufschlagt und in einem so geringen Abstand zu der Probe geführt wird, dass ein messbarer Strom zwischen der Spitze und der Probe fließt und ein Sensor und Signalwandler S gebildet und im Bereich der Kraftwechselwirkung eingesetzt wird, der den durch den Spitze-Probe-Kontakt fließenden Strom in Abhängigkeit von der Stärke der Kraftwechselwirkung verändert. Ein Rastertunnelmikroskop hierzu ist offenbart.
(EN)
The invention relates to a method for measuring the force interaction that is caused by a sample, wherein a bias voltage compared to the sample is applied to a tip and the tip is guided at a such a small distance to the sample that a measurable current flows between the tip and the sample and a sensor and signal converter S is formed and used in the area of the force interaction, which area changes the current flowing through the tip-sample contact according to the intensity of the force interaction. A scanning tunneling microscope therefor is disclosed.
(FR)
L'invention concerne un procédé de mesure de l'interaction de forces provoquée par une sonde, une pointe étant soumise à une tension de polarisation contre la sonde et étant guidée à une très faible distance de la sonde, de telle sorte qu'un courant mesurable circule entre la pointe et la sonde et qu'un capteur et convertisseur de signaux S, qui modifie le courant circulant par le contact pointe-sonde en fonction de l'intensité de l'interaction de forces, soit formé et utilisé dans la zone de l'interaction de forces. L'invention concerne également un microscope à effet tunnel associé.
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