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1. WO2011010409 - TEST APPARATUS, ADDITIONAL CIRCUIT, AND BOARD FOR TESTING

Publication Number WO/2011/010409
Publication Date 27.01.2011
International Application No. PCT/JP2010/001330
International Filing Date 26.02.2010
IPC
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 31/31924
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
317Testing of digital circuits
3181Functional testing
319Tester hardware, i.e. output processing circuit
31917Stimuli generation or application of test patterns to the device under test [DUT]
31924Voltage or current aspects, e.g. driver, receiver
G11C 2029/5006
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
29Checking stores for correct operation ; ; Subsequent repair; Testing stores during standby or offline operation
04Detection or location of defective memory elements ; , e.g. cell constructio details, timing of test signals
50Marginal testing, e.g. race, voltage or current testing
5006Current
G11C 29/56
GPHYSICS
11INFORMATION STORAGE
CSTATIC STORES
29Checking stores for correct operation ; ; Subsequent repair; Testing stores during standby or offline operation
56External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Applicants
  • 株式会社アドバンテスト ADVANTEST CORPORATION [JP]/[JP] (AllExceptUS)
  • 橋本好弘 HASHIMOTO, Yoshihiro [JP]/[JP] (UsOnly)
Inventors
  • 橋本好弘 HASHIMOTO, Yoshihiro
Agents
  • 龍華国際特許業務法人 RYUKA IP Law Firm
Priority Data
12/603,35021.10.2009US
PCT/JP2009/00348223.07.2009JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) TEST APPARATUS, ADDITIONAL CIRCUIT, AND BOARD FOR TESTING
(FR) APPAREIL DE TEST, CIRCUIT ADDITIONNEL ET CARTE À TESTER
(JA) 試験装置、付加回路および試験用ボード
Abstract
(EN)
Provided is a test apparatus for testing a device to be tested. This test apparatus is equipped with a power source which generates source electric power to be supplied to the device to be tested; a transmission path through which source electric power generated by the power source is transmitted to the device to be tested; an intermediate capacitor provided between the transmission path and a ground potential; a charging/discharging current measuring unit which measures charging/discharging current of the intermediate capacitor; and a load current calculating unit whereby load current flowing into the device to be tested is calculated on the basis of current measured by the charging/discharging current measuring unit.
(FR)
La présente invention concerne un appareil de test permettant de tester un dispositif devant être testé. Ledit appareil de test comprend une source d'alimentation qui génère une alimentation électrique source devant être fournie au dispositif à tester ; un canal de transmission via lequel l'alimentation électrique source générée par la source d'alimentation est transmise au dispositif à tester ; un condensateur intermédiaire situé entre le trajet de transmission et un potentiel à la terre ; une unité de mesure du courant de charge/décharge qui mesure le courant de charge/décharge du condensateur intermédiaire ; et une unité de calcul de courant de charge qui calcule le courant de charge circulant dans le dispositif à tester sur la base du courant mesuré par l'unité de mesure du courant de charge/décharge.
(JA)
 被試験デバイスを試験する試験装置であって、被試験デバイスに供給する電源電力を生成する電源と、電源が生成した電源電力を、被試験デバイスに伝送する伝送路と、伝送路および接地電位の間に設けられた中間コンデンサと、中間コンデンサの充放電電流を測定する充放電電流測定部と、充放電電流測定部が測定した電流に基づいて、被試験デバイスに流れる負荷電流を算出する負荷電流算出部とを備える試験装置を提供する。
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