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1. WO2011004889 - SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, PROCESS FOR PRODUCING SAME, AND MASS SPECTROMETRY

Publication Number WO/2011/004889
Publication Date 13.01.2011
International Application No. PCT/JP2010/061684
International Filing Date 09.07.2010
IPC
G01N 27/64 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
62by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
64using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
G01N 27/62 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
62by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
H01J 49/04 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
H01J 49/14 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
10Ion sources; Ion guns
14using particle bombardment, e.g. ionisation chambers
CPC
H01J 49/0418
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
0409Sample holders or containers
0418for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI], surface enhanced laser desorption/ionisation [SELDI] plates
Applicants
  • 大日本塗料株式会社 Dai Nippon Toryo Co., Ltd. [JP]/[JP] (AllExceptUS)
  • 川崎 英也 KAWASAKI Hideya [JP]/[JP] (UsOnly)
  • 荒川 隆一 ARAKAWA Ryuichi [JP]/[JP] (UsOnly)
  • 溝口 大剛 MIZOGUCHI Daigou [JP]/[JP] (UsOnly)
  • 室内 聖人 MUROUCHI Masato [JP]/[JP] (UsOnly)
  • 田村 祐介 TAMURA Yusuke [JP]/[JP] (UsOnly)
Inventors
  • 川崎 英也 KAWASAKI Hideya
  • 荒川 隆一 ARAKAWA Ryuichi
  • 溝口 大剛 MIZOGUCHI Daigou
  • 室内 聖人 MUROUCHI Masato
  • 田村 祐介 TAMURA Yusuke
Agents
  • 佐々木 一也 SASAKI Kazuya
Priority Data
2009-16331810.07.2009JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) SUBSTRATE FOR MASS SPECTROMETRIC ANALYSIS, PROCESS FOR PRODUCING SAME, AND MASS SPECTROMETRY
(FR) SUBSTRAT POUR ANALYSE PAR SPECTROMÉTRIE DE MASSE, SON PROCÉDÉ DE PRODUCTION, ET SPECTROMÉTRIE DE MASSE
(JA) 質量分析用基板及びその製造方法並びに質量分析法
Abstract
(EN)
A substrate for mass spectrometric analysis is provided with which it is possible to further advance the performance of a matrix-free ionization method and to conduct analysis by laser desorption ionization-mass spectrometry without requiring the use of an ionizing agent which can be causative of noise or a decrease in detection sensitivity. Also provided is a process for producing the substrate. The substrate for mass spectrometric analysis comprises a base equipped thereon with a metal oxide to which an organic substance capable of supplying protons and/or cations is adherent. The process for producing the substrate for mass spectrometric analysis comprises: coating a base with a metal oxide dispersion obtained by dispersing a metal oxide with the aid of an organic substance capable of supplying protons and/or cations; and drying the coating.
(FR)
L'invention porte sur un substrat pour une analyse par spectrométrie de masse, à l'aide duquel il est possible d'améliorer encore plus les performances d'une méthode d'ionisation sans matrice, et d'effectuer une analyse par une spectrométrie de masse à ionisation à désorption laser, sans exiger l'utilisation d'un agent d'ionisation, qui peut être à l'origine d'un bruit ou d'une diminution de la sensibilité de la détection. Elle porte aussi sur le procédé de production du substrat. Le substrat pour analyse par spectrométrie de masse comprend une base qui porte un oxyde métallique auquel adhère une substance organique capable de fournir des protons et/ou des cations. Le procédé de production du substrat pour analyse par spectrométrie de masse comprend : l'application, sur une base, d'une dispersion d'oxyde métallique obtenue par dispersion d'un oxyde métallique à l'aide d'une substance organique capable de fournir des protons et/ou des cations; et le séchage du revêtement.
(JA)
 マトリックスフリーなイオン化法を更に高性能化することができると共に、ノイズや検出感度低下の原因になるおそれがあるイオン化剤を必要とせずに、レーザー脱離イオン化質量分析を行うことができる質量分析用基板、及びその製造方法を提供する。 プロトン及び/又はカチオンを供給可能な有機物が付着した金属酸化物を、基材上に備える質量分析用基板であり、また、プロトン及び/又はカチオンを供給可能な有機物で金属酸化物を分散させた金属酸化物分散液を、基材上に塗布して乾燥させる質量分析用基板の製造方法である。
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