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1. WO2011003917 - MONITORING THE EFFECTIVE AGE OF ELECTRONIC COMPONENTS OR ASSEMBLIES

Publication Number WO/2011/003917
Publication Date 13.01.2011
International Application No. PCT/EP2010/059662
International Filing Date 06.07.2010
IPC
G01R 31/28 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
CPC
G01R 31/006
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
005Testing of electric installations on transport means
006on road vehicles, e.g. automobiles or trucks
G01R 31/2849
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2832Specific tests of electronic circuits not provided for elsewhere
2836Fault-finding or characterising
2849Environmental or reliability testing, e.g. burn-in or validation tests
G01R 31/2874
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28Testing of electronic circuits, e.g. by signal tracer
2851Testing of integrated circuits [IC]
2855Environmental, reliability or burn-in testing
2872related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
2874related to temperature
Applicants
  • CONTI TEMIC MICROELECTRONIC GMBH [DE]/[DE] (AllExceptUS)
  • FRIEDRICH, Ferdinand [DE]/[DE] (UsOnly)
  • GREIF, Andreas [DE]/[DE] (UsOnly)
  • GREUL, Roland [AT]/[AT] (UsOnly)
Inventors
  • FRIEDRICH, Ferdinand
  • GREIF, Andreas
  • GREUL, Roland
Agents
  • BONN, Roman
Priority Data
10 2009 032 063.607.07.2009DE
Publication Language German (DE)
Filing Language German (DE)
Designated States
Title
(DE) ÜBERWACHUNG DES EFFEKTIVEN LEBENSALTERS VON ELEKTRONISCHEN BAUTEILEN ODER BAUGRUPPEN
(EN) MONITORING THE EFFECTIVE AGE OF ELECTRONIC COMPONENTS OR ASSEMBLIES
(FR) SURVEILLANCE DE L'ÂGE EFFECTIF DE COMPOSANTS OU DE BLOCS ÉLECTRONIQUES
Abstract
(DE)
Verfahren zur Bestimmung der Restlebensdauer eines elektronischen Bauteils bzw. einer elektronischen Baugruppe, bei dem ab dem Zeitpunkt der Inbetriebnahme des elektronischen Bauteils bzw. der elektronischen Baugruppe Anzahl und Größe von zeitlichen Veränderungen der Temperaturen des elektronischen Bauteils bzw. der elektronischen Baugruppe und/oder von einem oder mehreren ausgewählten Bereichen des elektronischen Bauteils bzw. der elektronischen Baugruppe ermittelt und aufgezeichnet werden, wobei zu jeweils vorgegebenen Zeitpunkten nach der Inbetriebnahme des elektronischen Bauteils bzw. der elektronischen Baugruppe auf Grundlage der ermittelten Temperaturänderungen die Restlebensdauer des elektronischen Bauteils oder der elektronischen Baugruppe errechnet wird.
(EN)
The invention relates to a method for determining the residual life of an electronic component or of an electronic assembly, wherein, starting from the time at which the electronic component or the electronic assembly is put into operation, the number and extent of temporal changes of the temperatures of the electronic component or of the electronic assembly, and/or of one or more select areas of the electronic component or of the electronic assembly are determined and recorded, wherein at the respectively predetermined times after the electronic component or the electronic assembly was put into operation, the residual life of the electronic component or of the electronic assembly is calculated on the basis of the temperature changes that were determined.
(FR)
L'invention porte sur un procédé pour déterminer la durée de vie résiduelle d'un composant électronique ou d'un bloc électronique, dans lequel, à partir du moment de la mise en service du composant électronique ou du bloc électronique, on détermine le nombre et la taille de modifications temporelles des températures du composant électronique ou du bloc électronique et/ou d'une ou plusieurs zones sélectionnées du composant électronique ou du bloc électronique, et on les enregistre, procédé dans lequel, à des instants prédéfinis après la mise en service du composant électronique ou du bloc électronique, on calcule, sur la base des variations de température ainsi déterminées, la durée de vie résiduelle du composant électronique ou du bloc électronique.
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