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1. WO2011002117 - HIGH SENSITIVITY LOCALIZED SURFACE PLASMON RESONANCE SENSOR AND SENSOR SYSTEM USING SAME

Publication Number WO/2011/002117
Publication Date 06.01.2011
International Application No. PCT/KR2009/003576
International Filing Date 01.07.2009
IPC
G01N 21/27 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27using photo-electric detection
G01N 21/41 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
41Refractivity; Phase-affecting properties, e.g. optical path length
CPC
B82Y 15/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
15Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
B82Y 20/00
BPERFORMING OPERATIONS; TRANSPORTING
82NANOTECHNOLOGY
YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
20Nanooptics, e.g. quantum optics or photonic crystals
G01N 21/554
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
55Specular reflectivity
552Attenuated total reflection
553and using surface plasmons
554detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
G01N 21/648
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
64Fluorescence; Phosphorescence
645Specially adapted constructive features of fluorimeters
648using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
G01N 21/658
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63optically excited
65Raman scattering
658enhancement Raman, e.g. surface plasmons
Applicants
  • 한국과학기술연구원 KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY [KR]/[KR] (AllExceptUS)
  • 이경석 LEE, Kyeong Seok [KR]/[KR] (UsOnly)
  • 김원목 KIM, Won Mok [KR]/[KR] (UsOnly)
  • 이택성 LEE, Taek Sung [KR]/[KR] (UsOnly)
Inventors
  • 이경석 LEE, Kyeong Seok
  • 김원목 KIM, Won Mok
  • 이택성 LEE, Taek Sung
Agents
  • 김순영 KIM, Sun-young
Priority Data
Publication Language Korean (KO)
Filing Language Korean (KO)
Designated States
Title
(EN) HIGH SENSITIVITY LOCALIZED SURFACE PLASMON RESONANCE SENSOR AND SENSOR SYSTEM USING SAME
(FR) CAPTEUR À RÉSONANCE DES PLASMONS DE SURFACE LOCALISÉE À HAUTE SENSIBILITÉ ET SYSTÈME DE CAPTEURS L'UTILISANT
(KO) 고민감도 국소 표면 플라즈몬 공진 센서 및 이를 이용한 센서 시스템
Abstract
(EN)
The present invention relates to a high sensitivity localized surface plasmon resonance sensor and to a sensor system using same, the sensor comprising: a first metal layer including a first metal; a second metal layer arranged parallel to the first metal layer and including a second metal; and a conductive cross-linking layer disposed between the first metal layer and the second metal layer, and made of a third metal having a corrosion response that is different than that of the first metal and of the second metal.
(FR)
La présente invention concerne un capteur à résonance des plasmons de surface localisée à haute sensibilité et un système de capteurs l'utilisant, le capteur comprenant : une première couche métallique comprenant un premier métal ; une deuxième couche métallique disposée parallèlement à la première couche métallique et comprenant un deuxième métal ; et une couche conductrice de réticulation disposée entre la première couche métallique et la deuxième couche métallique, et constituée d'un troisième métal dont la réponse à la corrosion est différente de celles du premier métal et du deuxième métal.
(KO)
본 발명은 고민감도 국소 표면 플라즈몬 공진 센서 및 이를 이용한 센서 시스템에 관한 것으로, 제 1 금속을 포함하는 제 1 금속층, 상기 제 1 금속층에 평행하게 배열되고, 제 2 금속을 포함하는 제 2 금속층 및 상기 제 1 금속층과 상기 제 2 금속층의 사이에 위치하고, 상기 제 1 금속 및 상기 제 2 금속과 부식 반응성이 상이한 제 3 금속으로 이루어진 전도성 가교층을 포함하는 국소 표면 플라즈몬 공진 센서에 관한 것이다.
Also published as
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