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1. WO2011000665 - METHOD AND APPARATUS FOR THE CONTACTLESS DETERMINATION OF THE THICKNESS OF A WEB OF MATERIAL, INCLUDING CORRECTION OF THE ALIGNMENT ERROR

Publication Number WO/2011/000665
Publication Date 06.01.2011
International Application No. PCT/EP2010/057885
International Filing Date 07.06.2010
IPC
G01B 11/06 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
02for measuring length, width, or thickness
06for measuring thickness
G01B 21/08 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
02for measuring length, width, or thickness
08for measuring thickness
D21F 7/06 2006.01
DTEXTILES; PAPER
21PAPER-MAKING; PRODUCTION OF CELLULOSE
FPAPER-MAKING MACHINES; METHODS OF PRODUCING PAPER THEREON
7Other details of machines for making continuous webs of paper
06Indicating or regulating the thickness of the layer; Signal devices
G01B 7/06 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7Measuring arrangements characterised by the use of electric or magnetic means
02for measuring length, width, or thickness
06for measuring thickness
CPC
D21F 7/06
DTEXTILES; PAPER
21PAPER-MAKING; PRODUCTION OF CELLULOSE
FPAPER-MAKING MACHINES; METHODS OF PRODUCING PAPER THEREON
7Other details of machines for making continuous webs of paper
06Indicating or regulating the thickness of the layer; Signal devices
G01B 11/0691
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
02for measuring length, width or thickness
06for measuring thickness, e.g. of sheet material
0691of objects while moving
G01B 21/08
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups
02for measuring length, width, or thickness
08for measuring thickness
G01B 2210/44
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
2210Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
40Caliper-like sensors
44with detectors on both sides of the object to be measured
G01B 7/107
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7Measuring arrangements characterised by the use of electric or magnetic means
02for measuring length, width or thickness
06for measuring thickness
10using magnetic means, e.g. by measuring change of reluctance
107for measuring objects while moving
Applicants
  • VOITH PATENT GMBH [DE]/[DE] (AllExceptUS)
  • TYPPO, Pekka [FI]/[US] (UsOnly)
  • KNABE, Willy [DE]/[DE] (UsOnly)
  • BRÖCKEL, Jörg [DE]/[DE] (UsOnly)
Inventors
  • TYPPO, Pekka
  • KNABE, Willy
  • BRÖCKEL, Jörg
Common Representative
  • VOITH PATENT GMBH
Priority Data
61/222,64802.07.2009US
Publication Language German (DE)
Filing Language German (DE)
Designated States
Title
(DE) VERFAHREN UND VORRICHTUNG ZUR BERÜHRUNGSLOSEN BESTIMMUNG DER DICKE EINER MATERIALBAHN MIT KORREKTUR DES AUSRICHTFEHLERS
(EN) METHOD AND APPARATUS FOR THE CONTACTLESS DETERMINATION OF THE THICKNESS OF A WEB OF MATERIAL, INCLUDING CORRECTION OF THE ALIGNMENT ERROR
(FR) PROCÉDÉ ET DISPOSITIF DESTINÉS À LA DÉTERMINATION SANS CONTACT DE L'ÉPAISSEUR D'UNE BANDE DE MATÉRIAU AVEC CORRECTION DU DÉFAUT D'ALIGNEMENT
Abstract
(DE)
Ein Verfahren zur berührungslosen Bestimmung der Dicke einer Materialbahn, insbesondere Faserstoffbahn, mittels einer Sensoranordnung, die wenigstens zwei optische Messeinheiten umfasst, zwischen denen die Materialbahn hindurchführbar ist und die auf ihrer der Materialbahn zugewandten Seite jeweils eine Messplatte aufweisen, wobei über die auf einander gegenüberliegenden Seiten der Materialbahn angeordneten optischen Messeinheiten jeweils deren Abstand zur Materialbahn ermittelt und mittels einer Auswerteeinheit aus den ermittelten Abständen zwischen diesen optischen Messeinheiten und der Materialbahn sowie dem Abstand zwischen diesen auf einander gegenüberliegenden Seiten der Materialbahn angeordneten optischen Messeinheiten die Dicke der Materialbahn bestimmt wird, zeichnet sich dadurch aus, dass den auf einander gegenüberliegenden Seiten der Materialbahn angeordneten optischen Messeinheiten jeweils mehrere voneinander beabstandete optische Sensoren zugeordnet werden und dass mittels der Auswerteeinheit anhand der über die optischen Sensoren erhaltenen Messwerte der Kippwinkel der Messplatten zur Materialbahn und/oder ein Versatz zwischen den auf einander gegenüberliegenden Seiten der Materialbahn angeordneten optischen Messeinheiten bzw. deren Messplatten ermittelt wird.
(EN)
Disclosed is a method for the contactless determination of the thickness of a web of material, especially a web of fibrous material, by means of a sensor array comprising at least two optical measurement units, between which the web can be guided. Each of the optical measurement units includes a measurement plate on the side facing the web. The optical measurement units, which are arranged on opposite sides of the web, are used to measure the distance of the measurement units from the web, and an evaluation unit is used to determine the thickness of the web from the determined distances between the optical measurement units and the web and the distance between the optical measurement units arranged on opposite sides of the web. The disclosed method is characterized in that multiple optical sensors which are disposed at a distance from each other are associated with the optical measurement units arranged on opposite sides of the web, and in that the evaluation unit is used to determine the angle of inclination of the measurement plates relative to the web and/or an offset between the optical measurement units arranged on opposite sides of the web or between the measurement plates of said units on the basis of the measured values obtained from the optical sensors.
(FR)
L'invention concerne un procédé destiné à la détermination sans contact de l'épaisseur d'une bande de matériau, notamment d'une bande de matière fibreuse, au moyen d'un dispositif de détection qui comprend au moins deux unités de mesure optiques entre lesquelles passe la bande de matériau et qui présentent chacune une plaque de mesure sur leur face orientée vers la bande de matériau. Les unités de mesure optiques disposées sur des faces opposées de la bande de matériau permettent de déterminer leur distance respective par rapport à la bande de matériau et une unité d'analyse permet de déterminer l'épaisseur de la bande de matériau à partir des distances déterminées entre les unités de mesure optiques et la bande de matériau et à partir de la distance entre les unités de mesure optiques disposées sur des faces opposées de la bande de matériau. L'invention est caractérisée en ce que les unités de mesure optiques disposées sur des faces opposées de la bande de matériau sont chacune associées à plusieurs capteurs optiques espacés les uns des autres et en ce qu'au moyen de l'unité d'analyse et des valeurs de mesure obtenues par les capteurs optiques, l'angle d'inclinaison des plaques de mesure par rapport à la bande de matériau et/ou un décalage entre les unités de mesure optiques disposées sur des faces opposées de la bande de matériau ou entre leurs plaques de mesure sont déterminés.
Also published as
Latest bibliographic data on file with the International Bureau