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Machine translation
1. (WO2010151364) METHOD AND APPARATUS FOR INSPECTING SCRIBES IN SOLAR MODULES
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2010/151364    International Application No.:    PCT/US2010/031728
Publication Date: 29.12.2010 International Filing Date: 20.04.2010
IPC:
H01L 31/18 (2006.01), H01L 31/042 (2006.01)
Applicants: APPLIED MATERIALS, INC. [US/US]; 3050 Bowers Avenue Santa Clara, California 95054 (US) (For All Designated States Except US).
SCHLEZINGER, Asaf [IL/US]; (US) (For US Only)
Inventors: SCHLEZINGER, Asaf; (US)
Agent: PATTERSON, B., Todd; Patterson & Sheridan, L.L.P. 3040 Post Oak Blvd., Suite 1500 Houston, Texas 77056-6582 (US)
Priority Data:
12/492,989 26.06.2009 US
Title (EN) METHOD AND APPARATUS FOR INSPECTING SCRIBES IN SOLAR MODULES
(FR) PROCÉDÉ ET APPAREIL POUR INSPECTER DES TRACÉS DANS DES MODULES SOLAIRES
Abstract: front page image
(EN)Embodiments of the present invention generally relate to a method and apparatus for inspecting and analyzing the spacing of isolation trenches scribed in a solar module during the fabrication process. In one embodiment, images of the scribed trenches are captured and analyzed at various points in the fabrication process. The results may then be used either manually or in an automated fashion to diagnose, alter, and tune upstream processes for improved scribe spacing on subsequently processed solar modules.
(FR)L'invention concerne généralement un procédé et un appareil pour inspecter et analyser l'espacement de rainures d'isolation tracées dans un module solaire pendant le processus de fabrication. Dans un mode de réalisation, des images de rainures tracées sont prises et analysées en divers points du processus de fabrication. Les résultats peuvent ensuite être utilisés soit manuellement, soit de façon automatisée pour diagnostiquer, modifier et affiner les processus en amont en vue d'obtenir un espacement de tracés amélioré sur les modules solaires traités ultérieurement.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)