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Machine translation
1. (WO2010136826) A METHOD OF DERIVING IMPROVED DATA FROM A MASS SPECTROMETER
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2010/136826    International Application No.:    PCT/GB2010/050926
Publication Date: 02.12.2010 International Filing Date: 01.06.2010
IPC:
H01J 49/00 (2006.01), H01J 49/42 (2006.01)
Applicants: MICROMASS UK LIMITED [GB/GB]; Floats Road Wythenshawe Manchester M23 9LZ (GB) (For All Designated States Except US).
GORDON, David [GB/GB]; (GB) (For US Only).
LITTLE, David Richard [GB/GB]; (GB) (For US Only).
FAROOQ, Amir [GB/GB]; (GB) (For US Only)
Inventors: GORDON, David; (GB).
LITTLE, David Richard; (GB).
FAROOQ, Amir; (GB)
Agent: HEPWORTH BROWNE; Bourton Hall Rugby Warwickshire CV23 9SD (GB)
Priority Data:
12/474,562 29.05.2009 US
12/474,763 29.05.2009 US
12/474,597 29.05.2009 US
12/474,530 29.05.2009 US
12/474,548 29.05.2009 US
Title (EN) A METHOD OF DERIVING IMPROVED DATA FROM A MASS SPECTROMETER
(FR) PROCÉDÉ D'OBTENTION DE DONNÉES AMÉLIORÉES PROVENANT D'UN SPECTROMÈTRE DE MASSE
Abstract: front page image
(EN)The invention relates to a method of deriving improved data from a mass spectrometer. The method includes operating the mass spectrometer in a mode enabling quantitation; assigning a threshold value for the total ion current (TIC) above which at least MS and/or MSMS data is desired; and triggering the mass spectrometer out of the mode enabling quantitation into at least an MS and/or MSMS mode when said TIC rises above the threshold but triggering only at such time at or after a confirmed TIC maxima has been reached.
(FR)L'invention concerne un procédé d'obtention de données améliorées provenant d'un spectromètre de masse. Le procédé comprend la mise en fonctionnement du spectromètre de masse dans un mode permettant une quantification; l'attribution d'une valeur seuil pour le courant ionique total (TIC) au-dessus duquel au moins des données SM et/ou SMSM sont souhaitées; et le déclenchement du spectromètre de masse en dehors du mode permettant une quantification dans au moins un mode SM et/ou SMSM quand ledit TIC dépasse le seuil mais seulement au moment ou après qu'un TIC maximum confirmé a été atteint.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)