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Machine translation
1. (WO2010123620) METHODS AND SYSTEM FOR ELECTROSTATIC DISCHARGE PROTECTION OF THIN-FILM TRANSISTOR BACKPLANE ARRAYS
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2010/123620    International Application No.:    PCT/US2010/025043
Publication Date: 28.10.2010 International Filing Date: 23.02.2010
IPC:
G09G 3/00 (2006.01)
Applicants: ARIZONA BOARD OF REGENTS, A BODY CORPORATE ACTING FOR AND ON BEHALF OF ARIZONA STATE UNIVERSITY [US/US]; 1475 North Scottsdale Road Skysong Suite 200 Scottsdale, AZ 85257-9908 (US) (For All Designated States Except US).
BAWOLEK, Edward, J. [US/US]; (US) (For US Only).
MOYER, Curtis, D. [US/US]; (US) (For US Only).
VENUGOPAL, Sameer, M. [IN/US]; (US) (For US Only)
Inventors: BAWOLEK, Edward, J.; (US).
MOYER, Curtis, D.; (US).
VENUGOPAL, Sameer, M.; (US)
Agent: HARPER, David, S.; McDonnell Boehnen Hulbert & Berghoff LLP 300 S. Wacker Drive Suite 3100 Chicago, IL 60606 (US)
Priority Data:
61/172,500 24.04.2009 US
Title (EN) METHODS AND SYSTEM FOR ELECTROSTATIC DISCHARGE PROTECTION OF THIN-FILM TRANSISTOR BACKPLANE ARRAYS
(FR) PROCÉDÉS ET SYSTÈME POUR UNE PROTECTION, VIS-À-VIS D'UNE DÉCHARGE ÉLECTROSTATIQUE, DE RÉSEAUX DE PANNEAUX ARRIÈRES DE TRANSISTORS EN COUCHES MINCES
Abstract: front page image
(EN)The present invention provides devices and methods for testing the electrical performance of thin- film transistor backplane arrays and protecting thin- films during testing and handling.
(FR)La présente invention porte sur des dispositifs et sur des procédés pour tester la performance électrique de réseaux de panneaux arrières de transistors en couches minces et protéger les couches minces lors du test et de la manipulation.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)