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1. (WO2010122718) AUTOMATIC ANALYSIS DEVICE

Pub. No.:    WO/2010/122718    International Application No.:    PCT/JP2010/002526
Publication Date: Fri Oct 29 01:59:59 CEST 2010 International Filing Date: Thu Apr 08 01:59:59 CEST 2010
IPC: G01N 35/02
Applicants: HITACHI HIGH-TECHNOLOGIES CORPORATION
株式会社 日立ハイテクノロジーズ
CHIDA, Satoru
千田悟
IWAMATSU, Hirokazu
岩松博和
SHIMIZU, Kano
清水協
NAKAMURA, Kazuhiro
中村和弘
UMINO, Kiyotaka
海野清孝
Inventors: CHIDA, Satoru
千田悟
IWAMATSU, Hirokazu
岩松博和
SHIMIZU, Kano
清水協
NAKAMURA, Kazuhiro
中村和弘
UMINO, Kiyotaka
海野清孝
Title: AUTOMATIC ANALYSIS DEVICE
Abstract:
Provided is an automatic analysis device capable of, when a specimen on which an analysis could not be performed or a specimen necessary to be re-measured occurs due to the occurrence of an abnormality, quickly reloading the specimen on which the analysis could not be performed or the specimen necessary to be re-measured due to the occurrence of the abnormality without waiting the completion of the measurements of the other specimens mounted on a rack. The automatic analysis device is provided with a means for storing information of a rack loaded in the device and specimen information, displaying identification information of the rack loaded into the device for a user, identifying a specimen necessary to be re-analyzed due to the occurrence of an abnormality or a specimen intended to be retrieved for a re-measurement, and interrupting an analysis performed on a specimen rack on which the specimen is mounted and then instructing to retrieve the specimen. This makes it possible to retrieve and reload a specific specimen.