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1. (WO2010122007) IMPROVING FUNCTIONAL COVERAGE USING COMBINATIONAL TEST DESIGN
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2010/122007 International Application No.: PCT/EP2010/055168
Publication Date: 28.10.2010 International Filing Date: 20.04.2010
IPC:
G06F 11/263 (2006.01)
Applicants: UR, Shmuel[IL/IL]; IL (UsOnly)
INTERNATIONAL BUSINESS MACHINES CORPORATION[US/US]; New Orchard Road Armonk, New York 10504, US (AllExceptUS)
IBM UNITED KINGDOM LIMITED[GB/GB]; PO Box 41, North Harbour Portsmouth Hampshire PO6 3AU, GB (MG)
Inventors: UR, Shmuel; IL
Agent: WILLIAMS, Julian, David; IBM United Kingdom Limited Intellectual Property Law Hursley Park Winchester Hampshire SO21 2JN, GB
Priority Data:
12/427,77322.04.2009US
Title (EN) IMPROVING FUNCTIONAL COVERAGE USING COMBINATIONAL TEST DESIGN
(FR) AMÉLIORATION DE LA COUVERTURE FONCTIONNELLE AU MOYEN D'UNE CONCEPTION DE TEST COMBINATOIRE
Abstract: front page image
(EN) A generator generates tests to improve functional coverage. A functional coverage of a first set of tests is examined in respect to a functional coverage model. The functional coverage model is transformed to a combinatorial model. The coverage measurements are used to refine the combinatorial model. The combinatorial model is utilized to generate a second set of tests that have a different functional coverage than the first set of tests. The second set of tests is utilized to examine quality of a tested system
(FR) Un générateur produit des tests pour améliorer la couverture fonctionnelle. Une couverture fonctionnelle d'un premier ensemble de tests est examinée par rapport à un modèle de couverture fonctionnelle. Le modèle de couverture fonctionnelle est transformé en modèle combinatoire. Les mesures de couverture sont utilisées pour affiner le modèle combinatoire. Le modèle combinatoire est utilisé pour produire un second ensemble de tests qui ont une couverture fonctionnelle différente du premier ensemble de tests. Le second ensemble de tests est utilisé pour examiner la qualité d'un système testé.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)