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1. (WO2010121757) METHOD AND DEVICE FOR SPECTROMETRIC ELEMENTAL ANALYSIS

Pub. No.:    WO/2010/121757    International Application No.:    PCT/EP2010/002344
Publication Date: Fri Oct 29 01:59:59 CEST 2010 International Filing Date: Sat Apr 17 01:59:59 CEST 2010
IPC: G01N 21/67
Applicants: OBLF GESELLSCHAFT FÜR ELEKTRONIK UND FEINWERKTECHNIK MBH
OVERKAMP, Bringfried
NIEDERSTRASSER, Jörg
OVERKAMP, Jobst
Inventors: OVERKAMP, Bringfried
NIEDERSTRASSER, Jörg
OVERKAMP, Jobst
Title: METHOD AND DEVICE FOR SPECTROMETRIC ELEMENTAL ANALYSIS
Abstract:
The invention relates to a method and to a device for spectrometric elemental analysis of solid samples, wherein collision ionizations induce pulsed electrical gas discharges between an electrode and the sample under gas atmosphere, and a part of the sample is vaporized, atomized, and excited in the high-temperature plasmas that develop, and the emission radiation so generated is spectrally divided, detected, and analyzed by means of electronic data processing using optical systems, wherein a solution is provided by means of which the analysis time is particularly significantly shortened and/or the analysis capacity is increased. Said aim is achieved according to the method, in that at least two measurements of sequences of emission events take place at various places and overlapping in time, wherein the generating of emission events at a measurement point is performed in the pauses between the emission events of all other measurement points.