WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Options
Query Language
Stem
Sort by:
List Length
Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2010121165) METHOD AND APPARATUS FOR OPTICAL INTERFEROMETRIC MEASUREMENTS USING A REFERENCE REGION
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2010/121165 International Application No.: PCT/US2010/031436
Publication Date: 21.10.2010 International Filing Date: 16.04.2010
IPC:
C40B 30/04 (2006.01)
C CHEMISTRY; METALLURGY
40
COMBINATORIAL TECHNOLOGY
B
COMBINATORIAL CHEMISTRY; LIBRARIES, e.g. CHEMICAL LIBRARIES, IN SILICO LIBRARIES
30
Methods of screening libraries
04
by measuring the ability to specifically bind a target molecule, e.g. antibody-antigen binding, receptor-ligand binding
Applicants: BERGSTEIN, David, Alan[US/US]; US (UsOnly)
ZOIRAY TECHNOLOGIES INC.[US/US]; 8 St. Mary's Street, 6th Floor Boston, MA 02215, US (AllExceptUS)
Inventors: BERGSTEIN, David, Alan; US
Agent: BIEKER-BRADY, Kristina; Clark & Elbing LLP 101 Federal Street Boston, MA 02110, US
Priority Data:
61/169,93716.04.2009US
Title (EN) METHOD AND APPARATUS FOR OPTICAL INTERFEROMETRIC MEASUREMENTS USING A REFERENCE REGION
(FR) PROCÉDÉ ET APPAREIL PERMETTANT D'EFFECTUER DES MESURES INTERFÉROMÉTRIQUES OPTIQUES AU MOYEN D'UNE RÉGION DE RÉFÉRENCE
Abstract:
(EN) The invention features planar substrates and methods for optical interferometric measurements. Provided herein are planar substrates that include one or more reference regions and methods of making such planar substrates. Also provided are methods for determining an interference signal that is normalized to account for noise including the detecting an interference signal from one or more reference regions.
(FR) La présente invention a pour objet des substrats plans et des procédés permettant d'effectuer des mesures interférométriques optiques. La présente invention concerne des substrats plans qui comprennent une ou plusieurs régions de référence et des procédés de fabrication de tels substrats plans. La présente invention concerne également des procédés permettant de déterminer un signal d'interférence qui est normalisé pour tenir compte du bruit, impliquant la détection d'un signal d'interférence à partir d'une ou de plusieurs régions de référence.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)