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1. (WO2010117565) AUTOMATED TEST EQUIPMENT EMPLOYING TEST SIGNAL TRANSMISSION CHANNEL WITH EMBEDDED SERIES ISOLATION RESISTORS

Pub. No.:    WO/2010/117565    International Application No.:    PCT/US2010/027420
Publication Date: Fri Oct 15 01:59:59 CEST 2010 International Filing Date: Wed Mar 17 00:59:59 CET 2010
IPC: G01R 31/3183
G01R 31/28
Applicants: TERADYNE, INC.
JOHNSON, Gerald, H.
Inventors: JOHNSON, Gerald, H.
Title: AUTOMATED TEST EQUIPMENT EMPLOYING TEST SIGNAL TRANSMISSION CHANNEL WITH EMBEDDED SERIES ISOLATION RESISTORS
Abstract:
Automated test equipment for high-speed testing of devices under test (DUTs) includes a tester channel circuit generating a high-speed electrical test signal applied to the signal input terminal of each DUT, and a contacter board in physical and electrical contact with the DUTs. The contacter board has a high-speed signal transmission channel including (1) an electrical contact at which the high-speed electrical test signal is received, (2) conductive etch extending from the electrical contact to isolation areas each adjacent to the signal input terminal of a respective DUT, and (3) an embedded series isolation resistor formed on an inner layer of the contacter board at a respective isolation area forming a connection between the conductive etch and the adjacent signal input terminal of the respective DUT.