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1. (WO2010114727) MICROORGANISM CONCENTRATION PROCESS AND DEVICE
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2010/114727    International Application No.:    PCT/US2010/028122
Publication Date: 07.10.2010 International Filing Date: 22.03.2010
IPC:
C12M 1/12 (2006.01), B01D 39/14 (2006.01), B01D 37/00 (2006.01), B01D 69/02 (2006.01)
Applicants: 3M INNOVATIVE PROPERTIES COMPANY [US/US]; 3M Center Post Office Box 33427 Saint Paul, Minnesota 55133-3427 (US) (For All Designated States Except US).
KSHIRSAGAR, Manjiri, T. [US/US]; (US) (For US Only).
RABINS, Andrew, W. [US/US]; (US) (For US Only)
Inventors: KSHIRSAGAR, Manjiri, T.; (US).
RABINS, Andrew, W.; (US)
Agent: WEISS, Lucy, C.,; 3M CENTER Office of Intellectual Property Counsel Post Office Box 33427 Saint Paul, Minnesota 55133-3427 (US)
Priority Data:
61/166,266 03.04.2009 US
Title (EN) MICROORGANISM CONCENTRATION PROCESS AND DEVICE
(FR) PROCÉDÉ ET DISPOSITIF DE CONCENTRATION DE MICROORGANISMES
Abstract: front page image
(EN)A process for capturing or concentrating microorganisms for detection or assay comprises (a) providing a concentration device comprising a sintered porous polymer matrix comprising at least one concentration agent that comprises an amorphous metal silicate and that has a surface composition having a metal atom to silicon atom ratio of less than or equal to 0.5, as determined by X-ray photoelectron spectroscopy (XPS); (b) providing a sample comprising at least one microorganism strain; and (c) contacting the concentration device with the sample such that at least a portion of the at least one microorganism strain is bound to or captured by the concentration device.
(FR)L'invention concerne un procédé de capture ou de concentration de microorganismes pour une détection ou un test, qui comprend les étapes consistant à (a) fournir un dispositif de concentration comprenant une matrice polymère poreuse frittée comprenant au moins un agent de concentration qui comprend un silicate de métal amorphe et dont la composition de surface présente un rapport atomes de métal à atomes de silicium inférieur ou égal à 0,5, selon une détermination par spectroscopie photoélectronique par rayons X (SPX) ; (b) fournir un échantillon comprenant au moins une souche de microorganisme ; et (c) mettre le dispositif de concentration en contact avec l'échantillon de telle sorte qu'au moins une partie de la ou des souches de microorganisme soit liée au dispositif de concentration ou capturée par ce dispositif.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)