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1. (WO2010113926) MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND PROGRAM

Pub. No.:    WO/2010/113926    International Application No.:    PCT/JP2010/055649
Publication Date: Fri Oct 08 01:59:59 CEST 2010 International Filing Date: Wed Mar 31 01:59:59 CEST 2010
IPC: G01S 7/40
G01S 7/02
G01S 13/89
Applicants: NEC Corporation
日本電気株式会社
SHIBA Hisashi
斯波 尚志
Inventors: SHIBA Hisashi
斯波 尚志
Title: MEASUREMENT DEVICE, MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND PROGRAM
Abstract:
Provided is a technique capable of suppressing the deterioration in azimuth resolution and distance resolution in even a modulated and transmitted or received signal or a signal reflected by an object and varied in intensity when acquiring waveform information. A measurement device comprise: a plurality of sensors which receive waves propagating through a space; and a sampling timing calculation means which obtains, on the basis of the relative positions of the sensors and the velocities of the waves, the difference between the arrival times of the waves received by the respective sensors and calculates, for each sensor, sampling timing for acquiring the waveform information relating to the waves, on the basis of the difference between the arrival times.