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1. (WO2010113509) ULTRASOUND INSPECTION DEVICE AND ULTRASOUND INSPECTION METHOD
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2010/113509 International Application No.: PCT/JP2010/002383
Publication Date: 07.10.2010 International Filing Date: 31.03.2010
IPC:
G01N 29/26 (2006.01) ,G01N 29/04 (2006.01) ,G01N 29/06 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
29
Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
22
Details
26
Arrangements for orientation or scanning
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
29
Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
04
Analysing solids
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
29
Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
04
Analysing solids
06
Visualisation of the interior, e.g. acoustic microscopy
Applicants: ISOBE, Hideo[JP/JP]; JP (UsOnly)
ARAI, Ryoichi[JP/JP]; JP (UsOnly)
IKEDA, Takahiro[JP/JP]; JP (UsOnly)
YAMANE, Noriyuki[JP/JP]; JP (UsOnly)
KABUSHIKI KAISHA TOSHIBA[JP/JP]; 1-1, Shibaura 1-chome, Minato-ku, Tokyo 1058001, JP (AllExceptUS)
Inventors: ISOBE, Hideo; JP
ARAI, Ryoichi; JP
IKEDA, Takahiro; JP
YAMANE, Noriyuki; JP
Agent: SAKURA PATENT OFFICE, p.c.; Kanda Higashiyama Bldg. 1, Kandata-cho 2-chome Chiyoda-ku, Tokyo 1010046, JP
Priority Data:
2009-08975702.04.2009JP
Title (EN) ULTRASOUND INSPECTION DEVICE AND ULTRASOUND INSPECTION METHOD
(FR) DISPOSITIF D'INSPECTION À ULTRASONS ET PROCÉDÉ D'INSPECTION À ULTRASONS
(JA) 超音波検査装置及び超音波検査方法
Abstract:
(EN) Distance measurement ultrasonic sensors (7a, 7b) for detecting the distance to the surface of a target of inspection (1) and the inclination with respect to the surface of the target of inspection (1) are provided on an ultrasonic transducer (5). An ultrasound inspection device is configured such that the distance and inclination of the ultrasonic transducer (5) with respect to the target of inspection (1) is controlled based on the information detected by the distance measurement ultrasonic sensors (7a, 7b), and such that at least one portion of the ultrasonic transmission and reception by the distance measurement ultrasonic sensors (7a, 7b) is performed during aperture synthesis processing that the transmission and reception of the ultrasonic transducer (5) do not perform.
(FR) L'invention concerne des détecteurs à ultrasons pour la mesure d'une distance (7a, 7b) destinés à détecter la distance jusqu'à la surface d'une cible de l'inspection (1) et l'inclinaison par rapport à la surface de la cible de l'inspection (1), placés sur un transducteur à ultrasons (5). Un dispositif d'inspection à ultrasons est configuré de manière à ce que la distance et l'inclinaison du transducteur à ultrasons (5) par rapport à la cible de l'inspection (1) soient régulées en fonction des informations détectées par les détecteurs à ultrasons pour la mesure d'une distance (7a, 7b), et de manière à ce qu'au moins une partie de la transmission et réception d'ultrasons par les détecteurs à ultrasons pour la mesure d'une distance (7a, 7b) soit réalisée pendant un traitement de synthèse d'ouverture que la transmission et réception du transducteur à ultrasons (5) ne réalisent pas.
(JA)  超音波トランスデューサ5に、検査対象1の表面からの距離及び検査対象1の表面に対する傾きを検出するための距離計測用超音波センサ7a、7bを設け、距離計測用超音波センサ7a、7bが検出した情報に基づき超音波トランスデューサ5の検査対象1に対する距離及び傾きを制御するようにし、かつ、距離計測用超音波センサ7a、7bによる超音波送受信のうちの少なくとも一部を、超音波トランスデューサ5の送受信が行われない開口合成処理の実行中に行うようにした。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)