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Machine translation
1. (WO2010113015) SACRIFICIAL WAVEGUIDE TEST STRUCTURES
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2010/113015 International Application No.: PCT/IB2010/000716
Publication Date: 07.10.2010 International Filing Date: 30.03.2010
IPC:
G01M 11/00 (2006.01) ,H01S 5/02 (2006.01)
Applicants: WHITBREAD, Neil, David[GB/GB]; GB (UsOnly)
LANGLEY, Lloyd, Nicholas[GB/GB]; GB (UsOnly)
CARTER, Andrew, Cannon[GB/GB]; GB (UsOnly)
OCLARO TECHNOLOGY LIMITED[GB/GB]; Caswell, Towcester Northamptonshire NN12 8EQ, GB (AllExceptUS)
Inventors: WHITBREAD, Neil, David; GB
LANGLEY, Lloyd, Nicholas; GB
CARTER, Andrew, Cannon; GB
Priority Data:
61/165,60601.04.2009US
Title (EN) SACRIFICIAL WAVEGUIDE TEST STRUCTURES
(FR) STRUCTURES D'ESSAI SACRIFICIELLES DE GUIDE D'ONDES
Abstract: front page image
(EN) Sacrificial optical test structures are constructed upon a wafer (100) of pre-cleaved optical chips (10) for testing the optical functions of the pre-cleaved optical chips (10). The sacrificial optical structures are disabled upon the cleaving the optical chips (10) from the wafer (100) and the cleaved optical chips (10) can be used for their desired end functions. The test structures may remain on the cleaved optical chips (10) or they may be discarded.
(FR) L'invention porte sur des structures d'essai optiques sacrificielles, construites sur une tranche (100) de puces optiques pré-clivées (10), pour l'essai des fonctions optiques des puces optiques pré-clivées (10). Les structures optiques sacrificielles sont désactivées après que les puces optiques (10) ont été clivées de la tranche (100), et les puces optiques clivées (10) peuvent être utilisées pour leurs fonctions finales souhaitées. Les structures d'essai peuvent rester sur les puces optiques clivées (10), ou peuvent être mises au rebut.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)