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1. WO2010111795 - LIGHT SOURCE, AND OPTICAL COHERENCE TOMOGRAPHY MODULE

Publication Number WO/2010/111795
Publication Date 07.10.2010
International Application No. PCT/CH2010/000015
International Filing Date 22.01.2010
IPC
H01S 5/14 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
10Construction or shape of the optical resonator
14External cavity lasers
H01S 5/022 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
02Structural details or components not essential to laser action
022Mountings; Housings
G01B 9/02 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
9Instruments as specified in the subgroups and characterised by the use of optical measuring means
02Interferometers
G01N 21/47 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
47Scattering, i.e. diffuse reflection
CPC
G01B 9/02004
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
9Instruments as specified in the subgroups and characterised by the use of optical measuring means
02Interferometers ; for determining dimensional properties of, or relations between, measurement objects
02001characterised by manipulating or generating specific radiation properties
02002Frequency variation
02004by using a continuous frequency sweep or scan
G01B 9/02091
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
9Instruments as specified in the subgroups and characterised by the use of optical measuring means
02Interferometers ; for determining dimensional properties of, or relations between, measurement objects
02091Tomographic low coherence interferometers, e.g. optical coherence tomography
G01N 21/4795
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
17Systems in which incident light is modified in accordance with the properties of the material investigated
47Scattering, i.e. diffuse reflection
4795spatially resolved investigating of object in scattering medium
H01S 3/0813
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
3Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
05Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
08Construction or shape of optical resonators or components thereof
081comprising more than two reflectors
0813Configuration of resonator
H01S 5/02216
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
5Semiconductor lasers
02Structural details or components not essential to laser action
022Mountings; Housings
02208characterised by the shape of the housings
02216Butterfly-type, i.e. with electrode pins extending horizontally from the housings
H01S 5/02248
Applicants
  • EXALOS AG [CH]/[CH] (AllExceptUS)
  • LEWANDOWSKI, Jan [GB]/[CH] (UsOnly)
  • DUELK, Marcus [DE]/[CH] (UsOnly)
  • VELEZ, Christian [CH]/[CH] (UsOnly)
Inventors
  • LEWANDOWSKI, Jan
  • DUELK, Marcus
  • VELEZ, Christian
Agents
  • FREI PATENTANWALTSBÜRO AG
Priority Data
61/166,47003.04.2009US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) LIGHT SOURCE, AND OPTICAL COHERENCE TOMOGRAPHY MODULE
(FR) SOURCE DE LUMIÈRE, ET MODULE DE TOMOGRAPHIE PAR COHÉRENCE OPTIQUE
Abstract
(EN)
According to an aspect of the invention, a swept wavelength light source is provided, the light source comprising: - a semiconductor gain device operable to provide amplification, - an optical retarding device, the retarding device comprising a block of material, a beam path with a well-defined beam path length being defined for light within the block of material produced by the gain device, - a wavelength selector, and - the gain device, the retarding device and wavelength selector being mutually arranged on the base so that a resonator is established for light portions emitted by the gain device and selected by wavelength selector; this does not exclude the presence of further elements contributing to the resonator, such as additional mirrors (including resonator end mirrors), lenses, polarization selective elements, other passive optical components, etc.; - wherein the beam path in the retarding device is a part of a beam path of the resonator.
(FR)
Selon un aspect, l'invention porte sur une source de lumière à balayage de longueur d'onde, la source de lumière comprenant : un dispositif de gain à semi-conducteurs utilisable pour produire une amplification, un dispositif retardeur optique, le dispositif retardeur comprenant un bloc de matière, un chemin de faisceau ayant une longueur de chemin de faisceau bien définie qui est défini pour la lumière dans le bloc de matière produite par le dispositif de gain, et un sélecteur de longueur d'onde ; le dispositif de gain, le dispositif retardeur et le sélecteur de longueur d'onde étant mutuellement disposés sur la base de telle manière qu'un résonateur est établi pour des parties de lumière émises par le dispositif de gain et sélectionnées par le sélecteur de longueur d'onde. Cela n'exclut pas la présence d'autres éléments contribuant au résonateur, tels que des miroirs supplémentaires (comprenant des miroirs d'extrémité de résonateur), des lentilles, des éléments sélectifs en polarisation, d'autres éléments optiques passifs, etc. Le chemin de faisceau dans le dispositif retardeur est une partie d'un chemin de faisceau du résonateur.
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