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1. WO2010092739 - INTERFERENCE MEASURING DEVICE AND INTERFERENCE MEASURING METHOD

Publication Number WO/2010/092739
Publication Date 19.08.2010
International Application No. PCT/JP2010/000132
International Filing Date 13.01.2010
IPC
G01B 9/021 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
9Instruments as specified in the subgroups and characterised by the use of optical measuring means
02Interferometers
021using holographic techniques
G01B 11/24 2006.01
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
G02B 5/30 2006.01
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5Optical elements other than lenses
30Polarising elements
G03H 1/26 2006.01
GPHYSICS
03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
HHOLOGRAPHIC PROCESSES OR APPARATUS
1Holographic processes or apparatus using light, infra-red, or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
26Processes or apparatus specially adapted to produce multiple holograms or to obtain images from them, e.g. multicolour technique
CPC
G01B 11/2441
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11Measuring arrangements characterised by the use of optical means
24for measuring contours or curvatures
2441using interferometry
G01B 9/021
GPHYSICS
01MEASURING; TESTING
BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
9Instruments as specified in the subgroups and characterised by the use of optical measuring means
02Interferometers ; for determining dimensional properties of, or relations between, measurement objects
021using holographic techniques
G03H 1/041
GPHYSICS
03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
HHOLOGRAPHIC PROCESSES OR APPARATUS
1Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
04Processes or apparatus for producing holograms
0402Recording geometries or arrangements
041Optical element in the object space affecting the object beam, not otherwise provided for
G03H 1/0443
GPHYSICS
03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
HHOLOGRAPHIC PROCESSES OR APPARATUS
1Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
04Processes or apparatus for producing holograms
0443Digital holography, i.e. recording holograms with digital recording means
G03H 1/08
GPHYSICS
03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
HHOLOGRAPHIC PROCESSES OR APPARATUS
1Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
04Processes or apparatus for producing holograms
08Synthesising holograms, ; i.e. holograms synthesized from objects or objects from holograms
G03H 2001/0452
GPHYSICS
03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
HHOLOGRAPHIC PROCESSES OR APPARATUS
1Holographic processes or apparatus using light, infra-red or ultra-violet waves for obtaining holograms or for obtaining an image from them; Details peculiar thereto
04Processes or apparatus for producing holograms
0443Digital holography, i.e. recording holograms with digital recording means
0452arranged to record an image of the object
Applicants
  • 国立大学法人京都工芸繊維大学 NATIONAL UNIVERSITY CORPORATION KYOTO INSTITUTE OF TECHNOLOGY [JP]/[JP] (AllExceptUS)
  • 粟辻安浩 AWATSUJI, Yasuhiro (UsOnly)
  • 田原樹 TAHARA, Tatsuki (UsOnly)
Inventors
  • 粟辻安浩 AWATSUJI, Yasuhiro
  • 田原樹 TAHARA, Tatsuki
Agents
  • 特許業務法人原謙三国際特許事務所 HARAKENZO WORLD PATENT & TRADEMARK
Priority Data
2009-03144913.02.2009JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) INTERFERENCE MEASURING DEVICE AND INTERFERENCE MEASURING METHOD
(FR) DISPOSITIF DE MESURE D'INTERFÉRENCE ET PROCÉDÉ DE MESURE D'INTERFÉRENCE
(JA) 干渉計測装置および干渉計測方法
Abstract
(EN)
Disclosed is interference measuring device for acquiring an interference image used for acquiring three-dimensional information relating to a subject with dynamic variation. A digital holography device (60) of the invention is provided with a laser light source (1), a beam splitter (6) for splitting a laser beam into a reference light beam and an object light beam, and an image capturing element (2). The image capturing element (2) captures an image of the interference pattern formed by the reference light beam and the object light beam arriving via the subject (20). The digital holography device (60) is further provided with a polarized light splitting element (11) for splitting the object light beam into two kinds of object light beam having different directions of polarization and causing an angle difference between the directions of propagation thereof and a polarizer array device (30) in which first polarizer regions and second polarizer regions are arranged and which transmits the reference light beam and the object light beam arriving via the subject (20). Since the first and second polarizer regions of the polarizer array device (30) transmits the polarized components having different directions, capturing an image only once can form a plurality of interference patterns required for phase connection.
(FR)
L'invention porte sur un dispositif de mesure d'interférence pour acquérir une image d'interférence utilisée pour acquérir des informations tridimensionnelles concernant un sujet avec une variation dynamique. Un dispositif d'holographie numérique (60) selon l'invention comporte une source de lumière laser (1), un diviseur de faisceau (6) pour diviser un faisceau laser en un faisceau de lumière de référence et un faisceau de lumière objet, et un élément de capture d'image (2). L'élément de capture d'image (2) capture une image du motif d'interférence formé par le faisceau de lumière de référence et le faisceau de lumière objet arrivant par l'intermédiaire du sujet (20). Le dispositif d'holographie numérique (60) comporte en outre un élément de division de lumière polarisée (11) pour diviser le faisceau de lumière objet en deux types de faisceau de lumière objet ayant différentes directions de polarisation et provoquant une différence d'angle entre les directions de propagation de ceux-ci et un dispositif de réseau de polariseur (30) dans lequel des premières régions de polariseur et des secondes régions de polariseur sont agencées et qui transmet le faisceau de lumière de référence et le faisceau de lumière objet arrivant par l'intermédiaire du sujet (20). Étant donné que les premières et secondes régions de polariseur du dispositif de réseau de polariseur (30) transmettent les composantes polarisées dont les directions sont différentes, la capture d'une image une fois seulement peut former une pluralité de motifs d'interférence requis pour un raccord de phase.
(JA)
 動的な変化を伴う被写体の3次元情報を得るための干渉像を得ることができる干渉計測装置を実現する。本発明のデジタルホログラフィ装置(60)は、レーザ光源(1)と、レーザ光を参照光および物体光に分割するビームスプリッタ(6)と、撮像素子(2)とを備え、参照光と、被写体(20)を介して到達する物体光との干渉パターンを撮像素子(2)が撮像する干渉計測装置であって、物体光を互いに偏光方向が異なる2種類の物体光に分割し、それぞれの伝播方向に角度差を生じさせる偏光分割素子(11)と、第1偏光子領域および第2偏光子領域が複数配置され、参照光と、被写体(20)を介して到達する物体光とを通過させる偏光子アレイデバイス(30)とを備え、偏光子アレイデバイス(30)の第1偏光子領域および第2偏光子領域は互いに異なる方向の偏光成分を通過させるので、一回の撮像で位相接続に必要な複数の干渉パターンを得ることができる。
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