Search International and National Patent Collections
Some content of this application is unavailable at the moment.
If this situation persists, please contact us atFeedback&Contact
1. (WO2010085085) PARTICLE-MEASURING UNIT
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2010/085085 International Application No.: PCT/KR2010/000367
Publication Date: 29.07.2010 International Filing Date: 20.01.2010
IPC:
G01N 15/00 (2006.01) ,G01N 21/00 (2006.01) ,B05B 1/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15
Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
B PERFORMING OPERATIONS; TRANSPORTING
05
SPRAYING OR ATOMISING IN GENERAL; APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL
B
SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
1
Nozzles, spray heads or other outlets, with or without auxiliary devices such as valves, heating means
Applicants:
(주)에이치시티 HYUNDAI CALIBRATION & CERTIFICATION TECHNOLOGIES CO., LTD. [KR/KR]; 경기도 이천시 부발읍 아미리 산136-1 136-1, Ami-ri ,Bubal-eup ,Icheon-si Gyeonggi-do 467-701, KR (AllExceptUS)
안강호 AHN, Kang Ho [KR/KR]; KR (UsOnly)
강기태 KANG, Ki Tai [KR/KR]; KR (UsOnly)
안진홍 AN, Jin Hong [KR/KR]; KR (UsOnly)
윤진욱 YOON, Jin Uk [KR/KR]; KR (UsOnly)
권용택 KWON, Yong Taek [KR/KR]; KR (UsOnly)
Inventors:
안강호 AHN, Kang Ho; KR
강기태 KANG, Ki Tai; KR
안진홍 AN, Jin Hong; KR
윤진욱 YOON, Jin Uk; KR
권용택 KWON, Yong Taek; KR
Agent:
서재승 SEO, Jae Sung; 서울시 서초구 서초동 1543-10 양원빌딩3층 지혜안국제특허법률사무소 JI HAE AHN Intemational IP Law Firm 3F, YangWon Bldg, 1543-10, Seocho-Dong, Seocho-Gu Seoul 137-070, KR
Priority Data:
10-2009-000465520.01.2009KR
Title (EN) PARTICLE-MEASURING UNIT
(FR) UNITÉ DE MESURE DE PARTICULES
(KO) 입자 측정 유니트
Abstract:
(EN) The present invention relates to a particle-measuring unit comprising: a housing; and a condensation particle detection unit including an atomizer unit, a saturator, a condenser, and an optical condensation particle counter. The atomizer unit is disposed in the housing, in fluid communication with a high pressure DI water line and branched from the high pressure DI water line, and atomizes DI water containing particles. The saturator is arranged downstream from the atomizer unit in the housing, and saturates a saturated working fluid with the particles. The condenser condenses the particles with which the working fluid has been saturated by the saturator. The optical condensation particle counter counts the condensed saturated particles.
(FR) La présente invention concerne une unité de mesure de particules, qui comprend: un boîtier; et un bloc de détection de particules de condensation constitué d'un atomiseur, d'un saturateur, d'un condensateur et d'un compteur optique de particules de condensation. L'atomiseur est logé dans le boîtier, en communication fluidique avec une conduite d'eau DI à haute pression à laquelle il est branché, et atomise de l'eau DI contenant des particules. Le saturateur est disposé en aval de l'atomiseur, dans le boîtier, et sature de particules un fluide de travail saturé. Le condensateur condense les particules dont le fluide de travail est saturé par le saturateur. Le compteur optique de particules de condensation compte les particules saturées condensées.
(KO) 본 발명은, 하우징; 상기 하우징에 배치되고 고압 DI 워터 라인과 유체 소통을 이루고, 고압 DI워터 라인으로부터 분기되고 입자를 포함하는 DI 워터를 분무화시키는 아토마이저 유니트와, 상기 하우징의 내부로 상기 아토마이저 유니트의 하류에 배치되고 상기 입자를 포화 작동 유체로 포화시키는 포화기와, 상기 포화기에서 포화 작동 유체로 포화된 입자를 응축시키는 응축기와, 상기 응축된 포화 입자를 계수하는 응축 광학 계수기를 구비하는 응축 입자 검출부를 구비하는 입자 측정 유니트를 제공한다.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)