Search International and National Patent Collections
Some content of this application is unavailable at the moment.
If this situation persists, please contact us atFeedback&Contact
1. (WO2010082956) METHOD FOR ULTRASOUND PROBE REPAIR
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2010/082956 International Application No.: PCT/US2009/052434
Publication Date: 22.07.2010 International Filing Date: 31.07.2009
IPC:
G01N 29/24 (2006.01) ,A61B 8/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
29
Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
22
Details
24
Probes
A HUMAN NECESSITIES
61
MEDICAL OR VETERINARY SCIENCE; HYGIENE
B
DIAGNOSIS; SURGERY; IDENTIFICATION
8
Diagnosis using ultrasonic, sonic or infrasonic waves
Applicants:
WETSCO, INC. [US/US]; 12505-A East 55th Street Tulsa, OK 74146, US (AllExceptUS)
WULF, Dennis [US/US]; US (UsOnly)
BUSSE, Lawrence [US/US]; US (UsOnly)
MANUEL, Jay [US/US]; US (UsOnly)
HILL, Larry [US/US]; US (UsOnly)
Inventors:
WULF, Dennis; US
BUSSE, Lawrence; US
MANUEL, Jay; US
HILL, Larry; US
Agent:
EDWARDS, Alicia; Williams Center Tower II Two West Second Street, Suite 700 Tulsa, OK 74103-3117, US
Priority Data:
12/353,62714.01.2009US
Title (EN) METHOD FOR ULTRASOUND PROBE REPAIR
(FR) PROCÉDÉ DE RÉPARATION DE SONDE À ULTRASONS
Abstract:
(EN) Methods, systems, and devices are provided for the repair of a monolithic array comprised of elements. The method includes processes to identify damaged sections containing damaged elements in a damaged array, where each section contains contiguous elements with at least one damaged element; identify good sections in donor arrays that contain at least as many contiguous elements as those in each corresponding damaged section; removing the damaged sections from the damaged array; removing the good sections from the donor arrays; preparing the damaged array to receive the good sections; affixing the good sections to the damaged array; and testing the damaged array to ensure its characteristics are the same as those of an undamaged array.
(FR) L'invention concerne des procédés, des systèmes et des dispositifs pour la réparation d'une matrice monolithique composée d'éléments. Le procédé comprend des processus visant à identifier des sections endommagées contenant des éléments endommagés dans une matrice endommagée, chaque section contenant des éléments contigus à au moins un élément endommagé; à identifier des sections valides dans des matrices donneuses qui contiennent au moins autant d'éléments contigus que ceux contenus dans chaque section endommagée correspondante; à retirer les sections endommagées de la matrice endommagée; à retirer les sections valides de la matrice donneuse; à préparer la matrice endommagée pour recevoir les sections valides; à fixer les sections valides à la matrice endommagée; et à tester la matrice endommagée pour s'assurer que ses caractéristiques sont identiques à celles d'une matrice intacte.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)