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1. (WO2010079661) METHOD AND DEVICE FOR DETECTING CIRCUMFERENTIAL SURFACE DISTORTION
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2010/079661 International Application No.: PCT/JP2009/070486
Publication Date: 15.07.2010 International Filing Date: 07.12.2009
IPC:
G01B 11/24 (2006.01) ,G01B 11/30 (2006.01) ,G01N 21/952 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
24
for measuring contours or curvatures
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
30
for measuring roughness or irregularity of surfaces
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
95
characterised by the material or shape of the object to be examined
952
Inspecting the exterior surface of cylindrical bodies or wires
Applicants:
NTN株式会社 NTN CORPORATION [JP/JP]; 大阪府大阪市西区京町堀1丁目3番17号 3-17, Kyomachibori 1-chome, Nishi-ku, Osaka-shi, Osaka 5500003, JP (AllExceptUS)
小川 二美夫 OGAWA Fumio [JP/JP]; JP (UsOnly)
Inventors:
小川 二美夫 OGAWA Fumio; JP
Agent:
田中 秀佳 TANAKA Hideyoshi; 大阪府大阪市西区江戸堀1丁目15番26号 江原特許事務所 Ehara Patent Office, 15-26, Edobori 1-chome, Nishi-ku, Osaka-shi, Osaka 5500002, JP
Priority Data:
2009-00172407.01.2009JP
Title (EN) METHOD AND DEVICE FOR DETECTING CIRCUMFERENTIAL SURFACE DISTORTION
(FR) PROCÉDÉ ET DISPOSITIF PERMETTANT DE DÉTECTER UNE DISTORSION DE SURFACE CIRCONFÉRENTIELLE
(JA) 円周面の歪検出方法及び装置
Abstract:
(EN) Provided is a device for detecting distortion of a circumferential surface in an object.  The detection device includes: a drive device (1) which rotates the object around the center axial line in the circumferential surface; an illumination device (2) for illuminating the circumferential surface; a measurement device (3) for measuring the intensity of light reflected from the circumferential surface; and a control device (4) which checks the reflected light intensity obtained by the measurement device while correlating the intensity with the rotation position of the object.  Provided is also a detection method using the detection device.
(FR) La présente invention concerne un dispositif permettant de détecter une distorsion d’une surface circonférentielle dans un objet. Le dispositif de détection comprend : un dispositif d’entraînement (1) qui fait tourner l’objet autour de la ligne axiale centrale dans la surface circonférentielle ; un dispositif d’éclairage (2) permettant d’éclairer la surface circonférentielle ; un dispositif de mesure (3) permettant de mesurer l’intensité de la lumière réfléchie par la surface circonférentielle ; et un dispositif de commande (4) qui vérifie l’intensité lumineuse réfléchie obtenue par le dispositif de mesure tout en mettant en corrélation l’intensité avec la position de rotation de l’objet. L’invention concerne également un procédé de détection à l’aide du dispositif de détection.
(JA) 物体における円周面の歪検出装置であって、前記物体を前記円周面における中心軸線を中心にして回転させる駆動装置1と、円周面を光照射する照射装置2と、該円周面からの反射光強度を測定する測定装置3と、該測定装置によって得られる反射光強度を前記物体の回転位置と関連づけて判別するための制御装置4とを備えた歪検出装置及び該検出装置を用いた検出方法。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)