Search International and National Patent Collections
Some content of this application is unavailable at the moment.
If this situation persists, please contact us atFeedback&Contact
1. (WO2010076425) DEVICE FOR MEASURING THE THRESHOLD THICKNESS OF A LAYER OF PURELY RESISTIVE MATERIAL, MEASURING METHOD, METHOD FOR DIMENSIONING SUCH DEVICE, AND USE OF SUCH DEVICE IN AN EXHAUST PIPE
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2010/076425 International Application No.: PCT/FR2009/001444
Publication Date: 08.07.2010 International Filing Date: 17.12.2009
IPC:
G01B 7/06 (2006.01) ,G01N 27/04 (2006.01) ,F01N 11/00 (2006.01) ,F01N 9/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7
Measuring arrangements characterised by the use of electric or magnetic means
02
for measuring length, width, or thickness
06
for measuring thickness
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
02
by investigating impedance
04
by investigating resistance
F MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
01
MACHINES OR ENGINES IN GENERAL; ENGINE PLANTS IN GENERAL; STEAM ENGINES
N
GAS-FLOW SILENCERS OR EXHAUST APPARATUS FOR MACHINES OR ENGINES IN GENERAL; GAS-FLOW SILENCERS OR EXHAUST APPARATUS FOR INTERNAL-COMBUSTION ENGINES
11
Monitoring or diagnostic devices for exhaust-gas treatment apparatus
F MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
01
MACHINES OR ENGINES IN GENERAL; ENGINE PLANTS IN GENERAL; STEAM ENGINES
N
GAS-FLOW SILENCERS OR EXHAUST APPARATUS FOR MACHINES OR ENGINES IN GENERAL; GAS-FLOW SILENCERS OR EXHAUST APPARATUS FOR INTERNAL-COMBUSTION ENGINES
9
Electrical control of exhaust gas treating apparatus
Applicants:
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE [FR/FR]; 3, rue Michel Ange F-75016 Paris, FR (AllExceptUS)
UNIVERSITE DE BORDEAUX 1 [FR/FR]; 351, rue de la Libération F-33405 Talence Cedex, FR (AllExceptUS)
INSTITUT POLYTECHNIQUE DE BORDEAUX [FR/FR]; 1, rue du Docteur Albert Schweitzer F-33400 Talence, FR (AllExceptUS)
LUCAT, Claude [FR/FR]; FR (UsOnly)
MENIL, Francis, Louis [FR/FR]; FR (UsOnly)
Inventors:
LUCAT, Claude; FR
MENIL, Francis, Louis; FR
Agent:
CABINET ORES; 36, rue de St Pétersbourg F-75008 Paris, FR
Priority Data:
080713518.12.2008FR
Title (EN) DEVICE FOR MEASURING THE THRESHOLD THICKNESS OF A LAYER OF PURELY RESISTIVE MATERIAL, MEASURING METHOD, METHOD FOR DIMENSIONING SUCH DEVICE, AND USE OF SUCH DEVICE IN AN EXHAUST PIPE
(FR) DISPOSITIF DE MESURE D'UNE EPAISSEUR SEUIL DE COUCHE DE MATERIAU PUREMENT RESISTIF, PROCEDE DE MESURE, PROCEDE DE DIMENSIONNEMENT D'UN TEL DISPOSITIF ET UTILISATION D'UN TEL DISPOSITIF DANS UN POT D'ECHAPPEMENT
Abstract:
(EN) The invention relates to a simple, reliable, precise and economical device for detecting the threshold thickness of a deposit. The invention also relates to a device for measuring the threshold thickness of a layer of a purely resistive material, including a sensor with at least three electrodes (100a, 100b, 200a, 200b) for defining at least two electrode pairs (100, 200), each pair being arranged along a main longitudinal direction (DL) on the surface of a substrate (1). Each electrode includes a sub-electrode (100a-100b, 200a-200b) connected to a voltage source (2) through connections (10), and a means for measuring the resistances or intensities among the electrode pairs. The connections (10) are provided on the same surface of the substrate as the electrodes, laterally and substantially perpendicular relative to said electrodes. The electrode pairs differ from each other by at least a first parameter selected from the width and the spacing of the sub-electrodes, and a second parameter selected from the spacing, the width, the length and the adjustment of the sub-electrode supply voltage source, the second parameter being such that, during use, the resistance or intensity equality is obtained when the threshold thickness to be detected is deposited on the electrodes.
(FR) L'invention propose un dispositif de détection d'une épaisseur seuil de dépôt simple, fiable, précis et économique. L'invention concerne un dispositif de détection d'une épaisseur seuil d'une couche de matériau purement résistif, comprenant un capteur muni d'au moins trois électrodes (100a, 100b, 200a, 200b) pour définir au moins deux paires d'électrodes (100, 200), chaque paire étant disposée selon une direction longitudinale principale (DL) sur une face d'un support (1). Chaque électrode comprend une sous-électrode (100a-100b, 200a-200b) reliée à une source de tension (2) par l'intermédiaire de connexions (10), et un moyen de mesure des résistances ou des intensités entre les paires d'électrodes. Les connexions (10) sont disposées sur la même face du support que les électrodes, latéralement et sensiblement perpendiculairement par rapport aux électrodes. Les paires d'électrodes différent par au moins un premier paramètre pris parmi la largeur et l'espacement des sous-électrodes, et un deuxième paramètre pris parmi l'espacement, la largeur, la longueur et le réglage de la source de tension d'alimentation des sous-électrodes, le deuxième paramètre étant tel que, en utilisation, l'égalité de résistance ou d'intensité est obtenue lorsque l'épaisseur seuil à détecter est déposée sur les électrodes.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: French (FR)
Filing Language: French (FR)
Also published as:
EP2376864