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1. (WO2010074280) ANALYSIS APPARATUS
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2010/074280 International Application No.: PCT/JP2009/071720
Publication Date: 01.07.2010 International Filing Date: 18.12.2009
IPC:
G01N 21/35 (2014.01) ,A61B 5/00 (2006.01) ,A61B 5/103 (2006.01) ,G01N 1/22 (2006.01) ,G01N 21/3504 (2014.01) ,G01N 21/3586 (2014.01) ,G01N 22/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31
Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35
using infra-red light
A HUMAN NECESSITIES
61
MEDICAL OR VETERINARY SCIENCE; HYGIENE
B
DIAGNOSIS; SURGERY; IDENTIFICATION
5
Measuring for diagnostic purposes; Identification of persons
A HUMAN NECESSITIES
61
MEDICAL OR VETERINARY SCIENCE; HYGIENE
B
DIAGNOSIS; SURGERY; IDENTIFICATION
5
Measuring for diagnostic purposes; Identification of persons
103
Measuring devices for testing the shape, pattern, size or movement of the body or parts thereof, for diagnostic purposes
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
1
Sampling; Preparing specimens for investigation
02
Devices for withdrawing samples
22
in the gaseous state
[IPC code unknown for G01N 21/3504][IPC code unknown for G01N 21/3586]
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
22
Investigating or analysing materials by the use of microwaves
Applicants:
CANON KABUSHIKI KAISHA [JP/JP]; 30-2, Shimomaruko 3-chome, Ohta-ku, Tokyo 1468501, JP (AllExceptUS)
OUCHI, Toshihiko [JP/JP]; JP (UsOnly)
TAKEDA, Toshihiko [JP/JP]; JP (UsOnly)
Inventors:
OUCHI, Toshihiko; JP
TAKEDA, Toshihiko; JP
Agent:
OKABE, Masao; No. 602, Fuji Bldg., 2-3, Marunouchi 3-chome, Chiyoda-ku, Tokyo 1000005, JP
Priority Data:
2008-33160125.12.2008JP
2009-26522620.11.2009JP
Title (EN) ANALYSIS APPARATUS
(FR) APPAREIL D'ANALYSE
Abstract:
(EN) An analysis apparatus for analyzing a gas by a terahertz wave or an infrared ray comprises a generator (8) for generating the terahertz wave or the infrared ray; a trapping unit having a trapping film (3, 4) for trapping a gas and being placed to be capable of causing interaction between the gas trapped by the trapping film and the terahertz wave or infrared ray generated by the generator; and a detector (10) for detecting the interaction of the gas with the terahertz wave or infrared ray; wherein the trapping unit comprises a structure for contact with a site evolving the gas; and the structure holds the trapping film separately from the site.
(FR) L'invention porte sur un appareil d'analyse pour analyser un gaz par une onde térahertz ou un rayon infrarouge, lequel appareil comprend un générateur (8) pour générer l'onde térahertz ou le rayon infrarouge ; une unité de piégeage possédant un film de piégeage (3, 4) pour piéger un gaz et placée pour pouvoir provoquer une interaction entre le gaz piégé par le film de piégeage et l'onde térahertz ou le rayon infrarouge généré par le générateur ; et un détecteur (10) pour détecter l'interaction du gaz avec l'onde térahertz ou le rayon infrarouge ; l'unité de piégeage comprenant une structure destinée à être en contact avec un site faisant évoluer le gaz ; et la structure maintenant le film de piégeage à part du site.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
US20110198501