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1. (WO2010073784) SPECTROMETER
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2010/073784 International Application No.: PCT/JP2009/066526
Publication Date: 01.07.2010 International Filing Date: 24.09.2009
IPC:
G01N 21/01 (2006.01) ,G01N 21/63 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
Applicants:
浜松ホトニクス株式会社 HAMAMATSU PHOTONICS K.K. [JP/JP]; 静岡県浜松市東区市野町1126番地の1 1126-1, Ichino-cho, Higashi-ku, Hamamatsu-shi, Shizuoka 4358558, JP (AllExceptUS)
井口 和也 IGUCHI Kazuya [JP/JP]; JP (UsOnly)
鈴木 健吾 SUZUKI Kengo [JP/JP]; JP (UsOnly)
Inventors:
井口 和也 IGUCHI Kazuya; JP
鈴木 健吾 SUZUKI Kengo; JP
Agent:
長谷川 芳樹 HASEGAWA Yoshiki; 東京都千代田区丸の内二丁目1番1号 丸の内 MY PLAZA(明治安田生命ビル)9階 創英国際特許法律事務所 SOEI PATENT AND LAW FIRM, Marunouchi MY PLAZA (Meiji Yasuda Life Bldg.) 9th fl., 1-1, Marunouchi 2-chome, Chiyoda-ku, Tokyo 1000005, JP
Priority Data:
2008-32784524.12.2008JP
Title (EN) SPECTROMETER
(FR) SPECTROMÈTRE
(JA) 分光測定装置
Abstract:
(EN) A spectrometer (1A) equipped with: an integrating sphere (20) for examining the light to be emitted from a sample (S) to be examined; and a Dewar vessel (50) in which a medium (R) for regulating the temperature of the sample (S) is held so that the sample (S) is surrounded therewith and which includes a second container part (50b) located so as to face the inside of the integrating sphere (20).  By the use of the Dewar vessel (50), in which the medium (R) is held so as to surround the sample (S), the sample (S) can be easily regulated so as to have a desired temperature.  Since the second container part (50b) is located so as to face the inside of the integrating sphere (20), the temperature of the sample (S) is regulated with the medium (R) while inhibiting the environment surrounding the integrating sphere (20) from influencing the sample (S).  The sample (S) can hence be efficiently regulated so as to have a desired temperature.
(FR) L'invention concerne un spectromètre (1A) composé d'une sphère d'intégration (20) conçue pour examiner la lumière émise d'un échantillon(S) à examiner ; et d'un vase de Dewar (50) contenant un milieu (R) de régulation de la température de l'échantillon (S) entourant l'échantillon (S) et comprenant une seconde partie de récipient (50b) placée face à la partie intérieure de la sphère d'intégration (20). L'utilisation du vase de Dewar (50), dans lequel le milieu (R) est maintenu de façon à entourer l'échantillon (S), l'échantillon (S) permet de réguler facilement la température idéale. Du fait que la seconde partie du récipient (50b) est placée face à la partie intérieure de la sphère d'intégration (20), la température de l'échantillon (S) est régulée avec le milieu (R) tout en empêchant l'environnement entourant la sphère d'intégration (20) d'influencer l'échantillon (S). L'échantillon (S) peut alors être régulé efficacement afin d'atteindre une température souhaitée.
(JA)  分光測定装置1Aは、測定対象の試料Sから発せられる被測定光を観測するための積分球20と、試料Sが覆われるように試料Sの温度を調節するための媒体Rを保持すると共に、第2容器部50bが積分球20内に臨むように位置するデュワ50と、を備えている。試料Sが覆われるように媒体Rを保持するデュワ50を用いることにより、簡便に試料Sを所望の温度に調節することができる。第2容器部50bが積分球20内に臨むように位置することにより、積分球20の外部環境からの試料Sへの影響が抑制されつつ、試料Sの温度が媒体Rにより調節される。したがって、効率良く試料Sを所望の温度に調節することができる。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)
Also published as:
EP2320211US20110205537CN102265132KR1020110102870