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1. (WO2010072875) SAMPLE HOLDER FOR X-RAY MICROANALYSIS USING SCANNING ELECTRON MICROSCOPY
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2010/072875 International Application No.: PCT/ES2009/070601
Publication Date: 01.07.2010 International Filing Date: 17.12.2009
IPC:
H01J 37/20 (2006.01)
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
37
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
02
Details
20
Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
Applicants:
CONSEJO SUPERIOR DE INVESTIGACIONES CIENTÍFICAS (CSIC) [ES/ES]; C/ Serrano, 117 E-28006 Madrid, ES (AllExceptUS)
FORTUÑO ALOS, José Manuel [ES/ES]; ES (UsOnly)
SEGURA I NOGUERA, María del Mar [ES/ES]; ES (UsOnly)
Inventors:
FORTUÑO ALOS, José Manuel; ES
SEGURA I NOGUERA, María del Mar; ES
Agent:
PONS ARIÑO, Ángel; Glorieta de Rubén Darío, 4 E-28010 Madrid, ES
Priority Data:
P20080369624.12.2008ES
Title (EN) SAMPLE HOLDER FOR X-RAY MICROANALYSIS USING SCANNING ELECTRON MICROSCOPY
(ES) PORTAMUESTRAS PARA MICROANÁLISIS DE RAYOS X CON MICROSCOPÍA ELECTRÓNICA DE BARRIDO
(FR) PORTE-ÉCHANTILLONS POUR MICROANALYSE À RAYONS X PAR MICROSCOPIE ÉLECTRONIQUE À BALAYAGE
Abstract:
(EN) The invention relates to a novel sample holder (1) for X-ray microanalysis, which prevents interference between the signals from the sample and the signals from the sample holder (1) and which includes a base (2) bearing columns (3a, 3b, 3c) that support a bearing structure (4), preferably a cylinder with an upper lid (5) provided with a central opening (6), on which a grating containing the sample is placed.
(ES) La invención describe un nuevo portamuestras (1) para microanálisis de rayos X que evita interferencias entre las señales de la muestra y las señales del propio portamuestras (1), y que comprende una base (2) sobre la que se apoyan unas columnas (3a, 3b, 3c) que soportan una estructura (4) de soporte, preferentemente un cilindro cuyo extremo superior tiene una tapa (5) con un orificio central (6) sobre la que se coloca una rejilla que contiene la muestra.
(FR) La présente invention concerne un porte-échantillons (1) pour microanalyse à rayons X qui empêche les interférences entre les signaux de l'échantillon et les signaux du porte-échantillon lui-même (1) et qui comprend une base (2) sur laquelle reposent des colonnes (3a, 3b, 3c) qui soutiennent une structure (4) de support, de préférence un cylindre dont l'extrémité supérieure présente un couvercle (5) doté d'un orifice central (6) sur lequel est placée une grille qui contient l'échantillon.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PE, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG)
Publication Language: Spanish (ES)
Filing Language: Spanish (ES)